Sample Chamber Contact Electrode Integration
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Solution Overview
Problem
Existing sample chamber systems with exposed contact points are prone to damage, especially when using thin conductor layers or electrodes, which can lead to electrical connectivity issues during testing of biological and chemical samples.
Innovation Solution
A sample chamber design with contact electrodes entirely integrated within the bottom or cover plate, allowing for external electrical contact through the plate, eliminating the need for protruding contact points and enhancing protection against damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If contact points project over the device for receiving cells to establish electrical contact, then electrical connection is achieved, but the contact points and conductors are easily damaged
Solution Approach 1:
The patent transitions from protruding contact points (3D exposure) to planar contact electrodes integrated within the bottom or cover plate (2D integration). This dimensional change embeds the electrical contact interface within the plate structure, eliminating protrusion and vulnerability to mechanical damage while maintaining electrical connectivity through the plate material.
Solution Approach 2:
The contact electrode is nested within the bottom plate or cover plate structure, with the electrode integrated into the plate's thickness. This nesting approach protects the conductive element by embedding it within the protective housing of the plate, preventing external damage while allowing electrical contact through the plate.
2Device complexity
If conductors and electrodes are formed of very thin layers on thin carrier plates, then device complexity is reduced, but the contact points become easily damaged
Solution Approach 1:
The patent merges the contact electrode with the bottom plate or cover plate, creating an integrated structure where the electrode and plate function as a unified component. This merging provides mechanical support to the thin conductor layers through the plate's structural integrity, preventing damage while maintaining the simplicity of thin-film construction.
Solution Approach 2:
The plate structure serves as a protective cushion for the thin conductor layers and contact electrodes. By embedding the delicate electrical components within the plate's structure, the plate provides beforehand protection against mechanical stress, handling damage, and environmental factors that could compromise the thin layers.
Data Source
AI summary
The invention relates to a sample chamber for testing samples, comprising a bottom plate and a cover plate connected thereto, a sample reservoir for receiving a liquid and/or a sample to be tested, and a contact electrode which is arranged entirely in the bottom plate, in the cover plate or between the bottom plate and the cover plate and which is electrically conductively connected to a conductor element or semiconductor element disposed in and/or on the sample chamber, wherein the bottom plate and/or the cover plate are designed in such a way that an electrical contact with the contact electrode can be established from the outside in such a way that an electrically conductive connection to the conductor element or to the semiconductor element can be established from the outside through the bottom plate or through the cover plate via the contact electrode.