3D Sample Observation via Y-Axis Image Binarization
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Solution Overview
Problem
Existing sample observation devices struggle to process and analyze three-dimensional sample data efficiently, particularly in reducing the influence of background light variation and speeding up the analysis process.
Innovation Solution
A sample observation device and method that includes an irradiation optical system, scanning unit, imaging optical system, and analysis unit to acquire and process XZ image data, generate luminance and area image data by binarizing luminance values, and integrate data in the Y-axis direction to reduce processing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If three-dimensional sample information is acquired using selective plane illumination microscopy, then measurement precision is improved, but analysis time increases significantly
Solution Approach 1:
The patent applies preliminary action by performing binarization processing on XZ image data during the data acquisition phase, converting continuous luminance values into binary states (sample present/absent) before the analysis phase. This preprocessing step reduces data complexity in advance, enabling faster subsequent analysis without compromising the accuracy of three-dimensional sample reconstruction.
2Measurement precision
If complete XZ image data is processed for sample analysis, then analysis accuracy is improved, but processing speed decreases
Solution Approach 1:
The patent extracts only the essential information needed for analysis by binarizing the XZ image data, separating relevant sample information from irrelevant background data. This extraction process converts full-resolution luminance data into binary masks that retain sample structure information while eliminating redundant data, thereby maintaining analysis accuracy while dramatically reducing processing requirements.
3Productivity
If binarization processing is applied to XZ image data, then data processing speed is improved, but data volume is reduced
Solution Approach 1:
The patent applies parameter changes by transforming the data representation from continuous luminance values to binary states. This parameter transformation maintains the essential structural information of the sample while reducing data complexity, enabling faster processing without significant loss of analytically relevant information.
Data Source
AI summary
In a sample observation device, an image acquisition unit 6 acquires a plurality of pieces of image data of a sample in a Y-axis direction, and an image generation unit generates luminance image data on luminance of the sample on the basis of the plurality of pieces of image data, binarizes luminance values of each of the plurality of pieces of image data to generate a plurality of pieces of binarized image data, and generates area image data on an existing area of the sample on the basis of the plurality of pieces of binarized image data.