Sample Inspection Apparatus Using Magnetic Particle Counting
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Solution Overview
Problem
Sample inspection apparatuses using antigen-antibody reactions face challenges in achieving uniform measurement sensitivity due to the thickness of optical waveguides, leading to inaccurate determination of target substances at concentrations below or above certain limits, as light intensity changes are not distinct in these cases.
Innovation Solution
The apparatus incorporates photodetection circuitry, an image sensor, and processing circuitry to measure light intensity and count particles, using magnetic fields to manipulate antibodies and calculate concentration based on light attenuation and particle density, allowing for accurate determination of target substance presence and quantity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If light attenuation measurement is used for sensitive quantitative measurement, then measurement sensitivity is improved, but measurement precision deteriorates when target substance concentration is below or above certain limits
Solution Approach 1:
The patent combines two measurement methods: light attenuation measurement (for sensitive quantitative detection) and particle counting measurement (for reliable presence/absence determination). By merging these complementary approaches, the system achieves both high measurement sensitivity and reliable determination across a wide concentration range, resolving the contradiction between sensitivity and reliability.
Solution Approach 2:
The inspection apparatus is designed to perform multiple functions: it can measure light attenuation for quantitative analysis and count particles for qualitative determination. This multi-functionality allows the single device to maintain both high sensitivity through attenuation measurement and high reliability through particle counting, especially when using magnetic particles that enhance both measurement modes.
2Adaptability or versatility
If optical waveguide thickness is varied for measurement, then measurement range is improved, but measurement precision deteriorates due to non-uniform sensitivity
Solution Approach 1:
The patent changes the physical parameter of the optical waveguide by using magnetic particles with specific magnetic properties rather than varying the waveguide thickness. This allows the system to achieve different measurement sensitivities and ranges by adjusting particle characteristics while maintaining uniform waveguide properties, thereby preserving measurement precision across different measurement ranges.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate and quantitative measurement of target substances by combining light intensity and particle counting, overcoming the limitations of uniform sensitivity and concentration range issues, and eliminating the need for additional light sources for image sensing.
Implementation Method 1
measures the intensity of light propagating within an optical waveguide set in an inspection container containing the measurement sample
Implementation Method 2
using magnetic fields to manipulate antibodies and calculate concentration based on light attenuation and particle density
Implementation Method 3
measures the intensity of light propagating within an optical waveguide... determined with reference to the light changing its intensity according to the state of reaction
Implementation Method 4
The image sensor acquires an image signal for the optical waveguide, using scattered light originated from the light propagating within the optical waveguide, the scattered light being scattered by one or more particles in a vicinity of the optical waveguide
Data Source
AI summary
According to one embodiment, a sample inspection apparatus includes a photodetection circuitry, an image sensor, processing circuitry, and an output interface. The photodetection circuitry has light incident on an optical waveguide in an inspection container and detects the light having propagated within the optical waveguide and coming out of the optical waveguide. The image sensor acquires an image signal for the optical waveguide, using scattered light originated from the light propagating within the optical waveguide. The processing circuitry acquires one or more inspection index values based on at least one of an output of the photodetection circuitry or an output of the image sensor. The output interface outputs a result of processing by the processing circuitry.