Sample Inspection System Using Reference Beam for Vibration Compensation
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Solution Overview
Problem
Security scanning systems for restricted areas face inefficiencies due to mechanical vibrations and positional changes during screening processes, leading to inaccurate targeting of items within containers, as traditional systems rely heavily on human supervision and mechanical apparatus that can cause items to shift positions.
Innovation Solution
A sample inspection system utilizing a beam former to generate a primary beam of X-ray or gamma radiation, a beam modulator with an aperture to define an inspection volume, an energy resolving detector, and a collimator to detect diffracted or scattered radiation, along with a processor to generate contrast images and calculate atomic number and electron density, ensuring accurate location verification of items.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If automated processes are applied to security screening, then productivity and efficiency are improved, but measurement precision deteriorates due to mechanical vibrations and positional changes
Solution Approach 1:
The system employs a feedback mechanism where the first screening module identifies items of interest and communicates their coordinates to the second module. The second module then uses this information to target its inspection precisely at the identified location, creating a closed-loop system that maintains accuracy despite mechanical movements.
Solution Approach 2:
The patent replaces mechanical positioning systems with an optical/reference beam system. Instead of relying on mechanical apparatus to maintain precise positioning, the system uses a reference beam that passes through the same mechanical path as the inspection beam, allowing software-based compensation for mechanical vibrations and positional changes.
2Measurement precision
If multiple screening stages are implemented, then measurement precision is improved through targeted analysis, but device complexity increases due to multiple modules and coordination requirements
Solution Approach 1:
The screening system is divided into two distinct modules: a first module for initial broad screening and item identification, and a second module for targeted detailed inspection. This segmentation allows each module to be optimized for its specific function, reducing overall system complexity while maintaining high measurement precision.
Solution Approach 2:
The second screening module is designed with multi-functionality, capable of performing both detailed material analysis and position verification. This universal design reduces the need for additional specialized equipment, thereby managing device complexity while maintaining high identification accuracy.
3Measurement precision
If reference beam technique is used, then measurement precision is improved by compensating for mechanical vibrations, but device complexity increases due to additional beam path requirements
Solution Approach 1:
The reference beam path is merged with the inspection beam path, both passing through the same mechanical aperture and following the same optical trajectory. This merging approach allows the reference beam to automatically track mechanical movements and vibrations, providing compensation without requiring separate complex positioning systems.
Solution Approach 2:
The reference beam acts as an intermediary that carries information about mechanical vibrations and positional changes. By comparing the reference beam's behavior with the inspection beam's behavior, the system can compensate for mechanical disturbances without directly measuring them, simplifying the overall system architecture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides precise identification and location confirmation of items, enhancing the reliability and efficiency of security screening by comparing energy spectra and generating contrast images to verify the correct targeting of items despite mechanical vibrations and positional changes.
Implementation Method 1
upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation
Implementation Method 2
upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation
Implementation Method 3
a collimator arranged between the beam modulator and the energy resolving detector, the collimator comprising a plurality of channels, each channel being adapted to receive diffracted or scattered radiation
Implementation Method 4
the energy resolving detector being arranged to detect the reference beam and radiation scattered or diffracted by the sample
Implementation Method 5
comparing energy spectra and generating contrast images to verify the correct targeting of items
Data Source
Figure 1
Figure 2A~2C
Figure 3
AI summary
There is presented a sample inspection system and a corresponding method for inspecting a sample. The sample inspection system includes a beam former (220), a beam modulator (240) an energy resolving detector (260) and a collimator (250). The beam former is adapted to receive an electromagnetic radiation from an electromagnetic source (210) to generate a primary beam of electromagnetic radiation. The beam modulator (240) is provided at a distance from the beam former (220) to define a sample chamber. The collimator (250) is provided between the beam modulator (240) and the energy resolving detector (260). The collimator has a plurality of channels adapted to receive diffracted or scattered radiation. Upon incidence of the primary beam onto the beam modulator, the beam modulator provides a reference beam of diffracted or scattered radiation. The energy resolving detector (260) is arranged to detect the reference beam.