SAR ADC Noise Detection for Accurate Solid-State Imaging

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Solution Overview

Problem

Existing analog-digital conversion circuits, such as SARADC, are susceptible to errors due to power noise fluctuations in pixel power output, which affect the accuracy of signal conversion.

Innovation Solution

A solid state imaging element with a successive approximation type analog-digital conversion circuit and a noise detection circuit that detects power noise and adjusts gain and phase to cancel out noise interference at the comparator level, ensuring accurate digital conversion.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a conventional SARADC is used for analog-digital conversion, then the device maintains small power consumption and compact size, but power noise from the pixel array causes errors in the comparator output and reduces conversion accuracy

Engineering Contradiction:
Improveanalog-digital conversion accuracyVSAvoidpower noise influence
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

A noise detection circuit is introduced as an intermediary component that detects power noise at the DAC output node and generates a correction signal to compensate for the noise's effect on the comparator output, thereby improving conversion accuracy without increasing overall device complexity

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The noise detection circuit continuously monitors the DAC output node for power noise and feeds back a correction signal to the comparator or SAR logic, enabling real-time compensation that maintains high conversion accuracy despite the presence of power noise from the pixel array

Inventive Principle:
Principle #23Feedback

2Measurement precision

If noise correction circuitry is added to mitigate power noise influence, then conversion accuracy improves, but device complexity increases

Engineering Contradiction:
Improveanalog-digital conversion accuracyVSAvoidcircuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The noise detection circuit is localized to monitor only the critical DAC output node where power noise has the most significant impact, rather than implementing system-wide noise correction, thereby achieving effective noise mitigation with minimal additional circuit complexity

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The noise detection circuit creates a copy or representation of the noise signal present at the DAC output and uses this copied signal to generate the appropriate correction, avoiding the need for complex direct noise cancellation while maintaining accuracy

Inventive Principle:
Principle #26Copying

Data Source

PatentUS11405572B2Solid state imaging element, electronic apparatus, and power noise correction method
Publication Date: 2022.08.02 SONY SEMICON SOLUTIONS CORP
  • US11405572B2 patent drawing
  • US11405572B2 patent drawing
  • US11405572B2 patent drawing

AI summary

A solid state imaging element (100) includes: a successive approximation type analog-digital conversion circuit (140) converting an analog pixel signal received from a pixel of a pixel array portion (110) to a digital code; and a first noise detection circuit (130-1) connected to a DAC (Digital to Analog Converter) output node inside the successive approximation type analog-digital conversion circuit (140) and detecting power noise supplied to the pixel of the pixel array portion (110) to output a detection result to the DAC.