Dynamic Comparator Topology for Thermal and Kickback Noise in SAR ADCs

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Solution Overview

Problem

Comparators in successive approximation register digital-to-analog converters (SAR ADCs) face challenges with thermal noise degrading signal-to-noise ratio and kickback noise introducing non-linearity, which necessitate trade-offs between conversion speed and noise levels.

Innovation Solution

The comparator circuit design includes specific configurations of transistors and control signals to reduce thermal noise by accelerating the regeneration phase without affecting initial integration time, and incorporates cascode transistors to minimize kickback noise.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If dynamic comparator is used to increase conversion speed, then productivity is improved, but thermal noise increases degrading signal-to-noise ratio

Engineering Contradiction:
Improveconversion speedVSAvoidthermal noise
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The comparator operation is divided into distinct phases: an integration phase where inputs are sampled and held, followed by a regeneration phase where the output is amplified. This segmentation allows noise to be confined to specific time windows rather than continuously affecting the output, thereby improving signal-to-noise ratio while maintaining fast conversion speed.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The integration phase performs preliminary action by sampling and holding the input signals before the regeneration phase. This preliminary integration of the differential input voltage across a controlled period establishes a stable baseline that reduces the impact of subsequent noise during the regeneration and output phase.

Inventive Principle:
Principle #10Preliminary action

2Object-affected harmful factors

If regeneration phase is accelerated to reduce thermal noise, then signal-to-noise ratio is improved, but conversion speed may be affected

Engineering Contradiction:
Improvethermal noiseVSAvoidconversion speed
Core Design Contradiction:
Object-affected harmful factorsVSProductivity

Solution Approach 1:

The comparator employs dynamic control of transistor switching to accelerate the regeneration phase. By dynamically adjusting the switching timing and using positive feedback through cross-coupled transistors, the regeneration process is sped up, allowing the output to reach its final state faster, thus reducing thermal noise impact without sacrificing overall conversion speed.

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If cascode transistors are added to minimize kickback noise, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvelinearity of input-to-output conversionVSAvoidtransistor configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Cascode transistors are introduced as intermediary elements between the input differential pair and the output stage. These cascode devices act as mediators that isolate the input stage from the output loading effects, thereby reducing kickback noise and improving linearity. The cascode configuration provides impedance transformation and shielding that minimizes the direct coupling of noise back to the inputs.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS10727852B2Reduced noise dynamic comparator for a successive approximation register analog-to-digital converter
Publication Date: 2020.07.28 TEXAS INSTRUMENTS INC
  • US10727852B2 patent drawing
  • US10727852B2 patent drawing
  • US10727852B2 patent drawing

AI summary

A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.