Saw-Tooth Inspection Jig for Bent Lead Pin Alignment

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Solution Overview

Problem

Existing inspection jigs for semiconductor devices with lead pins are ineffective in correcting significant bending, necessitating additional steps and prolonging the inspection process.

Innovation Solution

An inspection jig with saw teeth structures and a pressing mechanism that aligns and applies pressure to lead pins, allowing for simultaneous correction and electrical connection, thereby shortening the inspection time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the inspection jig uses recesses in the contact pusher to guide lead pins, then lead pin bending can be corrected to some extent, but the correction effect is limited and greatly bent lead pins cannot be guided to the recesses

Engineering Contradiction:
Improvelead pin alignment precisionVSAvoidadaptability to different bending degrees
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The patent introduces a movable pressing portion that can dynamically adjust its position and apply variable pressure to the lead pins. This dynamic mechanism allows the jig to adapt to different bending degrees by adjusting the pressing force and position, enabling correction of greatly bent lead pins that static recesses cannot accommodate.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the physical parameters of the pressing portion, including its material properties, geometric dimensions, and elastic modulus, to optimize its pressing characteristics. These parameter changes enable the pressing portion to effectively correct lead pin bending while maintaining adaptability to various bending conditions.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If additional jigs are used to correct greatly bent lead pins before inspection, then lead pin bending can be corrected, but the inspection process time increases

Engineering Contradiction:
Improvelead pin bending correctionVSAvoidinspection process time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent merges the lead pin correction function and the electrical connection function into a single integrated inspection jig. The pressing portion that corrects lead pin bending is combined with the contact pusher that establishes electrical connection, allowing both correction and inspection to occur simultaneously in one process step, thereby eliminating the need for separate correction jigs and reducing inspection time.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The inspection jig performs the correction action preliminarily during the inspection process itself, rather than requiring separate pre-correction steps. The pressing portion automatically corrects lead pin bending as part of the inspection procedure, enabling immediate electrical connection and inspection without additional preparation time.

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If the pressing portion applies pressure to the lead pins to correct bending, then lead pin alignment improves, but the structure becomes more complex

Engineering Contradiction:
Improvelead pin alignmentVSAvoidinspection jig structure
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The pressing portion is designed with multi-functionality, serving both as a pressing mechanism for correcting lead pin bending and as a structural component of the inspection jig. This universal design reduces the need for separate dedicated components, thereby limiting the increase in structural complexity while achieving effective lead pin alignment.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20260050026A1Inspection jig
Publication Date: 2026.02.19 MITSUBISHI ELECTRIC CORP
  • US20260050026A1 patent drawing
  • US20260050026A1 patent drawing
  • US20260050026A1 patent drawing

AI summary

An inspection jig for a semiconductor device provided with a plurality of lead pins includes: a contact portion in which contact electrodes are formed at troughs of first saw teeth; and a pressing portion in which second saw teeth are formed. During inspection of the semiconductor device, the contact portion is disposed such that the troughs of the first saw teeth correspond to the plurality of lead pins, the pressing portion is disposed such that the second saw teeth apply, to the plurality of lead pins, pressure toward the troughs of the first saw teeth, and the pressing portion applies pressure to the contact portion in a direction in which the plurality of lead pins extend, so that the pressing portion and the contact portion integrally move in the direction in which the plurality of lead pins extend.