Single Crystal Ingot Sawing Slurry Distribution Control

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Solution Overview

Problem

The existing single crystal ingot sawing processes using wire saws face issues with slurry distribution, leading to nonuniform wafer slicing, excessive cooling, and deformation due to scattered or accumulated slurry, resulting in poor wafer quality and nanotopography errors.

Innovation Solution

A single crystal ingot sawing apparatus with a slurry bath and guide rollers is designed to control slurry distribution, featuring a slurry bath on both sides of the ingot with grooves for the wire saw and a slurry blocking cover to prevent slurry scattering, ensuring uniform slurry supply and preventing deformation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If slurry is supplied onto the wire saw during slicing, then slicing and lubricating functions are achieved, but scattered slurry permeates and accumulates between wafers causing deformation and nonuniform shape

Engineering Contradiction:
Improveslicing functionVSAvoidwafer shape uniformity
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The invention divides the slurry supply system into multiple nozzles positioned at different locations along the wire saw path. Each nozzle supplies slurry to a specific section, preventing excessive accumulation between wafers while ensuring adequate lubrication and slicing performance at each stage of the cutting process.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention implements location-specific slurry supply by positioning nozzles at different distances from the wire saw and adjusting their individual flow rates. This ensures that slurry is supplied uniformly at sections where it is needed while reducing or eliminating supply at sections where accumulation would cause deformation, thereby achieving local optimization of both slicing function and wafer shape uniformity.

Inventive Principle:
Principle #3Local quality

2Object-affected harmful factors

If slurry flow amount is reduced at the rear end of the ingot, then scattered slurry influence is minimized, but slurry curtain phenomenon does not occur leading to slicing quality degradation

Engineering Contradiction:
Improvescattered slurry influenceVSAvoidslicing quality
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

The invention employs adjustable flow rate nozzles that can be independently controlled at different positions along the wire saw path. This dynamic control system allows the slurry flow amount to be optimized at each section - maintaining sufficient flow at the rear end to prevent wire overheating and ensure slicing quality, while controlling the flow to prevent scattered slurry accumulation that would cause wafer deformation.

Inventive Principle:
Principle #15Dynamics

3Ease of manufacture

If slurry is supplied uniformly along the entire wire saw path, then slicing function is maintained, but excessive slurry accumulates between wafers causing deformation

Engineering Contradiction:
Improveslicing functionVSAvoidwafer shape uniformity
Core Design Contradiction:
Ease of manufactureVSShape

Solution Approach 1:

The invention implements location-specific slurry supply by positioning nozzles at different distances from the wire saw and adjusting their individual flow rates. This ensures that slurry is supplied uniformly at sections where it is needed while reducing or eliminating supply at sections where accumulation would cause deformation, thereby achieving local optimization of both slicing function and wafer shape uniformity.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus improves wafer shape uniformity, reduces waviness, and enhances nanotopography by stabilizing slurry supply, achieving better slicing quality and reducing deformation and waviness issues.

Implementation Method 1

a slurry bath for configured to receive slurry supplied onto the wire saw

Methodology Applied
Scientific EffectGravitation: Gravitation

Implementation Method 2

a slurry bath for configured to receive slurry supplied onto the wire saw

Methodology Applied
Scientific EffectSurface tension: Surface Tension

Implementation Method 3

the slurry (abrasive + oil) acting as slicing and lubricating agents in the wire saw

Methodology Applied
Scientific EffectAbrasion: Abrasion

Implementation Method 4

the slurry (abrasive + oil) acting as slicing and lubricating agents in the wire saw

Methodology Applied
Scientific EffectLubrication: Lubrication

Implementation Method 5

A plurality of guide rollers may be provided along a movement direction of the wire saw

Methodology Applied
Scientific EffectFriction: Friction

Data Source

PatentEP2621699B1Sawing apparatus of single crystal ingot
Publication Date: 2021.07.21 SK SILTRON CO LTD
  • EP2621699B1 patent drawingFigure 1~3
  • EP2621699B1 patent drawingFigure 4~6
  • EP2621699B1 patent drawingFigure 7~9

AI summary

Provided is a single crystal ingot sawing apparatus. The A single crystal ingot sawing apparatus includes a wire saw configured to slice an ingot, a roller for configured to drive the wire saw, and a slurry bath for configured to receive slurry supplied onto the wire saw.