Scalable Tester for Multiple Devices Using Modular Burn-in Board
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Solution Overview
Problem
Existing testing systems for devices under test (DUTs) are inflexible, require multiple passes and different testers, and rely on external fixtures and JTAG ports, leading to high costs and complexity, especially for complex integrated circuits, and often necessitate manual intervention and high power supplies.
Innovation Solution
A customizable and scalable test system configuration with modular electronics that can connect to any DUT, perform tests without external fixtures or JTAG ports, and operate under controlled temperatures, using a burn-in board with sockets and a computing device for analysis, allowing for efficient testing of DUTs with varying numbers of channels and pins.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a traditional testing board is used to test DUTs, then the DUTs can be tested with power supply and stimulus signals, but the testing board becomes complex and bulky requiring temperature control systems and multiple passes
Solution Approach 1:
The testing system is divided into modular components: a burn-in board with sockets for DUT placement, a separate tester with programmable resources, and optional temperature control. This segmentation allows the burn-in board to handle power and basic connectivity while the programmable tester handles complex testing functions, reducing overall system complexity.
Solution Approach 2:
The burn-in board is designed with universal sockets and wiring that can accommodate various DUT types and configurations. The tester uses programmable resources that can be configured for different testing scenarios, eliminating the need for multiple specialized testing boards and enabling single-pass testing of all DUT channels.
2Productivity
If a burn-in board with limited sockets is used, then DUTs can be placed for testing inside a test chamber, but the number of DUTs that can be tested simultaneously is limited
Solution Approach 1:
The testing system uses programmable resources that can be dynamically configured and allocated based on the number and type of DUTs being tested. The tester can adapt its channel allocation and resource distribution in real-time, allowing maximum utilization of available sockets without requiring additional hardware.
Solution Approach 2:
The system allows changing testing parameters such as channel allocation, stimulus signal characteristics, and measurement configurations through software programming. This enables the same physical hardware to effectively test varying numbers of DUTs by reconfiguring resource distribution rather than adding physical sockets.
3Reliability
If an external fixture identical in dimension with the DUT is used for checking test setup, then socket connectivity can be tested, but the tester becomes limited to DUTs of one particular dimension and becomes expensive
Solution Approach 1:
Instead of requiring physical fixtures identical to each DUT, the system uses electrical copying techniques where test signals are routed through the socket wiring to simulate DUT connectivity. The programmable tester can create virtual test configurations that replicate various DUT pinout patterns without physical duplication, enabling validation across different DUT dimensions.
Solution Approach 2:
The system changes the parameter of fixture rigidity to flexibility by using programmable electrical connections rather than fixed physical fixtures. The tester can reconfigure its internal wiring and signal routing to match different DUT pin configurations, allowing the same hardware to validate test setups for DUTs of various dimensions and types.
4Reliability
If JTAG ports are used for checking test setups with an FPGA tester, then test setup validation can be performed, but DUTs must have built-in JTAG blocks which limits applicability
Solution Approach 1:
The system extracts the test setup validation function from the DUT itself by using the burn-in board's socket wiring and the tester's programmable resources to perform connectivity checking independently of DUT features. This eliminates the requirement for JTAG blocks or other DUT-specific interfaces, allowing validation of any DUT that can be physically connected to the socket.
5Reliability
If multiple testers are used to test all channels of a DUT, then complete testing can be achieved, but the cost and complexity increase significantly
Solution Approach 1:
A single tester is designed with universal programmable resources that can be configured to test all channels of any DUT. The tester can dynamically allocate its channels and resources to cover the complete pinout of the DUT, whether it has few or many channels, eliminating the need for multiple specialized testers while maintaining complete testing coverage.
Data Source
AI summary
Various embodiments of the invention provide a system and a method for testing one or more devices under test (DUTs) and for checking one or more test setups. Each of the one or more test setups includes a test board having several sockets for receipt of a DUT. A custom hardware interface is used to electrically connect the test board, such as a burn-in board with a test system configuration having multiple modules that can be configured using a computer device and related software to provide customized testing of the DUTs. The system is scalable to accommodate any DUT having any number of channels and to provide customized testing. Results of the testing are sent to the computing device.