Scan-Based Voltage Frequency Scaling for SoC Power Management
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Solution Overview
Problem
Existing voltage frequency scaling methods are limited by large margins of error due to theoretical simulations and lack of real-time data, and monitor-based approaches often fail to accurately represent the system's power consumption and error rates, especially in dynamic environments like mobile devices.
Innovation Solution
The implementation of scan-based voltage frequency scaling using at-speed scans to gather real-time data on voltage, frequency, and temperature, which is then used to dynamically adjust system settings through an automatic testing equipment and power management controller, storing this data in a database to correlate with error rates and adjust voltage and frequency accordingly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If theoretical simulations are used for voltage frequency scaling, then the implementation is simple, but the accuracy is low due to large margins of error
Solution Approach 1:
The patent implements feedback by using at-speed scan data to monitor actual system behavior (power consumption, error rates) and dynamically adjusting voltage and frequency settings based on this real-time information. This closes the loop between theoretical predictions and actual performance, significantly improving accuracy while maintaining manageable complexity through automated control algorithms.
Solution Approach 2:
The system performs self-characterization by automatically collecting and analyzing its own operational data through at-speed scans. The system uses its internal resources (scan logic, performance monitors) to generate the data needed for optimization, eliminating the need for external characterization equipment and reducing overall system complexity while improving accuracy.
2Measurement precision
If monitor-based approaches are used to track power consumption, then the implementation is straightforward, but the representation accuracy is insufficient especially in dynamic environments
Solution Approach 1:
The patent transitions from static monitor-based measurements to dynamic at-speed scan measurements that adapt to changing system conditions. The scan-based approach captures real-time behavior under actual operating loads and conditions, providing accurate power consumption and error rate data even in highly dynamic mobile environments, thus resolving the contradiction between measurement accuracy and system performance.
3Measurement precision
If at-speed scans are performed to gather real-time data, then the measurement accuracy improves, but the testing time increases
Solution Approach 1:
The patent performs system characterization through at-speed scans during the manufacturing test phase, before the product is deployed. This preliminary characterization captures the unique behavior of each device, allowing for optimized voltage-frequency tables to be pre-computed and stored. During actual operation, the system simply looks up pre-determined settings rather than performing scans, thus achieving high accuracy without operational time penalties.
Solution Approach 2:
The system performs at-speed scans periodically during manufacturing testing at multiple voltage and frequency points to build a comprehensive characterization model. This periodic data collection during production, rather than during customer use, achieves accurate system modeling without impacting end-user productivity or adding ongoing time losses.
Data Source
AI summary
An example method for scan-based voltage frequency scaling can include performing a plurality of at-speed scan operation on a system on chip (SoC) at a plurality of respective voltage values. The example method can include entering data gathered from at least one of the plurality of at-speed scan operations into a database. The entered data is associated with the respective plurality of voltage value. The example method can include determining a particular voltage value of the respective plurality of voltage values at which a parameter of the SoC reaches a threshold. The example method can include indicating the determined particular voltage in the database. The indicated determined particular voltage in the database can be used for performing one or more operations using the SoC.