Multi-Stage Scan Circuit Layout for Stable Gate Driving

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Solution Overview

Problem

Existing display technologies face challenges in efficiently controlling image display in pixels due to limitations in gate driving circuits, particularly in the integration and performance of gate-on-array circuits within display panels.

Innovation Solution

A scan circuit design comprising multiple stages with specific subcircuits and transistors, including capacitors and transistors arranged in unique configurations to enhance control signals and improve gate driving efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Extent of automation

If gate-on-array circuits are integrated directly in the array substrate, then device integration is improved, but circuit area increases and layout complexity worsens

Engineering Contradiction:
Improveintegration of gate driving circuitVSAvoidcircuit area
Core Design Contradiction:
Extent of automationVSArea of stationary object

Solution Approach 1:

The scan circuit is divided into multiple stages, with each stage containing separate subcircuits (input subcircuit, output subcircuit, first processing subcircuit, second processing subcircuit, third processing subcircuit). This segmentation allows for modular layout optimization, reducing the overall circuit area while maintaining integration benefits.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Transistors are arranged in specific spatial configurations (e.g., eighth transistor on a side away from capacitors and other transistors along the first direction) to optimize the two-dimensional layout. This dimensional arrangement reduces circuit area occupation while maintaining electrical connectivity and functional performance.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If multiple capacitors and transistors are arranged in specific configurations, then signal transmission performance is improved, but layout complexity increases

Engineering Contradiction:
Improvesignal transmission stabilityVSAvoidlayout complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Different regions of the circuit are optimized with specific component placements. For example, capacitors are positioned in specific subcircuits (first capacitor in second processing subcircuit, third capacitor in third processing subcircuit) to locally optimize signal transmission stability without requiring complex global reconfiguration.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The circuit design allows for flexible signal transmission paths through the multi-stage architecture, where signals can be dynamically processed through different subcircuits (input, processing, output) depending on the scanning requirements, improving adaptability without fixed complex routing.

Inventive Principle:
Principle #15Dynamics

3Stability of the object's composition

If transistors are positioned away from capacitors, then voltage stability is improved, but circuit area increases

Engineering Contradiction:
Improvevoltage level stabilityVSAvoidcircuit area
Core Design Contradiction:
Stability of the object's compositionVSArea of stationary object

Solution Approach 1:

The circuit is segmented into distinct functional subcircuits with capacitors and transistors separated into different regions. This segmentation maintains voltage stability by isolating capacitive elements from transistor switching activity while keeping the overall circuit area compact through efficient modular arrangement.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS12542107B2Scan circuit and display apparatus
Publication Date: 2026.02.03 CHENGDU BOE OPTOELECTRONICS TECH CO LTD
  • US12542107B2 patent drawing
  • US12542107B2 patent drawing
  • US12542107B2 patent drawing

AI summary

A scan circuit having a plurality of stages is provided. A respective scan unit of the scan circuit in the respective stage of the plurality of stages includes an input subcircuit, an output subcircuit, a first processing subcircuit, a second processing subcircuit, and a third processing subcircuit. The respective scan unit includes a first capacitor in the second processing subcircuit; a third capacitor in the third processing subcircuit; an eighth transistor in the first processing subcircuit; and a ninth transistor and a tenth transistor in the output subcircuit. Along the first direction, the eighth transistor is on a side of the ninth transistor and the tenth transistor away from the first capacitor, the third capacitor, and other transistors of the respective scan unit.