Scan Driver Inspection Unit for Defective Stage Detection
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Solution Overview
Problem
Existing display devices lack an efficient method to detect and identify defective stages in the scan driver, leading to potential manufacturing costs and inefficiencies due to the need for additional processes after detecting defects.
Innovation Solution
A display device with an inspection unit that includes first and second transistors connected to the stages, utilizing a timing controller to supply a control signal and detect defective stages by analyzing the output voltages, allowing for the identification of defective stages while reducing the supply period of the control signal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a control signal is supplied to all stages during the entire scan signal period for inspection, then all stages can be detected, but the inspection time and control signal supply period increase
Solution Approach 1:
The scan driver is divided into multiple stages, and the inspection process segments the control signal supply to different time periods. By supplying control signals to stages in sequential time segments rather than simultaneously, the patent achieves complete stage coverage while reducing total inspection time. Each stage group receives control signals during its designated time period, enabling time-multiplexed inspection.
Solution Approach 2:
The patent employs periodic action by supplying control signals to different stage groups in alternating time periods. The timing controller activates control signals for odd-numbered stages during one period, then activates control signals for even-numbered stages in the next period, creating a periodic inspection pattern that reduces overall inspection time while maintaining comprehensive defect detection.
2Measurement precision
If additional inspection processes are added to detect defective stages, then defect identification capability improves, but device complexity increases
Solution Approach 1:
The inspection unit is designed with multi-functionality, where the same first transistors, second transistors, and detect line serve multiple purposes: detecting defects in odd-numbered stages during one time period and detecting defects in even-numbered stages during another time period. This universal structure eliminates the need for separate inspection circuits for different stage groups, reducing overall device complexity while maintaining comprehensive defect identification capability.
Solution Approach 2:
The scan driver stages perform self-inspection by utilizing their own output terminals and internal transistors to detect defects. The first transistors are turned on in response to control signals supplied to specific stages, allowing each stage to self-diagnose its functionality through the detect line without requiring external inspection equipment, thereby simplifying the overall inspection system.
Data Source
AI summary
There are provided a display device capable of detecting a defect of a scan driver. The display device includes pixels positioned in regions demarcated by scan lines and data lines, a scan driver including a plurality of stages connected to the scan lines, an inspection unit connected to the stages to detect whether the stages are defective, and including first transistors turned on when a control signal is supplied, and a timing controller supplying the control signal, wherein the timing controller detects a position of a defective stage by reducing a period during which the control signal is supplied.