Scan Driving Buffer Transistor Sizing for Display Panel Signal Timing

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Solution Overview

Problem

In display apparatuses, the RC delay in scan signals due to varying impedance across scan lines leads to inconsistent rising and falling times, affecting the brightness of pixels, especially in panels with differently loaded scan lines and varying numbers of connected pixels.

Innovation Solution

The implementation of a scan driving unit with buffers having transistors of varying sizes corresponding to the load of each scan line, ensuring that each buffer's transistor size matches the load it supplies to, thereby minimizing differences in rising and falling times of scan signals across the display panel.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If all buffers use the same transistor size, then the device complexity is reduced and manufacturing is simplified, but the scan signal rising and falling times become inconsistent across different scan lines due to varying loads

Engineering Contradiction:
Improveconsistency of scan signal timingVSAvoidvariation in transistor sizes
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies local quality by configuring each buffer's transistor size specifically according to its local load conditions. Buffers driving scan lines with higher loads (more pixels, longer lines, or lines closer to the center of circular panels) are assigned larger transistor sizes, while buffers with lower loads use smaller transistor sizes. This localized adaptation ensures consistent scan signal timing across all scan lines without requiring uniform complexity throughout the entire device.

Inventive Principle:
Principle #3Local quality

2Reliability

If buffer transistor sizes are increased to drive heavy loads, then the scan signal can be supplied to pixels with high load, but the RC delay increases and rising/falling times become slower

Engineering Contradiction:
Improveability to drive high-load scan linesVSAvoidRC delay time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent changes the parameter of transistor size dynamically according to the load requirements of each scan line. Rather than using a fixed transistor size for all buffers, the invention adjusts the transistor size parameter for each buffer based on factors such as the number of pixels connected to the scan line, the length of the scan line, and the position of the scan line in the display panel. This parameter adaptation allows each buffer to operate optimally for its specific load conditions, achieving reliable signal driving without excessive RC delay.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9666127B2Scan driving apparatus and display apparatus including the same
Publication Date: 2017.05.30 SAMSUNG DISPLAY CO LTD
  • US9666127B2 patent drawing
  • US9666127B2 patent drawing
  • US9666127B2 patent drawing

AI summary

A display apparatus includes a display panel including a plurality of scan lines and a plurality of pixels connected to the plurality of scan lines, and a scan driving unit to supply a scan signal to each of the plurality of pixels via the plurality of scan lines, the scan driving unit including a scan signal generation unit to generate the scan signal supplied to each of the plurality of scan lines, and a plurality of buffers respectively corresponding to the plurality of scan lines, each one of the plurality of buffers outputting a scan signal to a corresponding one of the plurality of scan lines, wherein each of the plurality of buffers includes a transistor having a size corresponding to a load of a circuit connected to an output end of a corresponding buffer.