Scan Test Interface Reuse for Parallel Content Delivery
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Solution Overview
Problem
Conventional test equipment struggles with high-pin-count and physically inaccessible components, such as ball grid array packages, and existing interfaces like JTAG and SSN are slow for delivering test, firmware, and software content, especially when multiple identical endpoints need testing.
Innovation Solution
Reusing scan test pins with unicast technology to deliver replicated content to multiple endpoints, and converting packetized interfaces for faster delivery of test, firmware, and software content using SSN pins for parallel packetized delivery.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If conventional test equipment and interfaces (JTAG, SSN) are used to deliver test content, firmware, and software, then the testing can be performed with existing infrastructure, but the delivery speed is slow and test time is excessive
Solution Approach 1:
The system dynamically switches between unicast and multicast delivery modes based on the test scenario requirements. The test controller can select unicast for individual endpoint testing and multicast for simultaneous testing of multiple identical endpoints, optimizing delivery speed for each specific test case
Solution Approach 2:
The system creates replicated copies of test content and distributes them simultaneously to multiple endpoints using multicast technology. This allows identical test patterns to be delivered to multiple endpoints in parallel, significantly reducing overall test time compared to sequential unicast delivery
2Device complexity
If scan test pins are reused for content delivery, then the number of required pins is reduced and device complexity is lowered, but the interface must perform multiple functions (scan testing and content delivery)
Solution Approach 1:
The scan test pins are designed to serve dual purposes: traditional scan testing operations and content delivery operations. The test controller intelligently configures the pins for different functions based on the current test phase, eliminating the need for separate dedicated content delivery pins and reducing overall device complexity
Solution Approach 2:
The interface configuration is dynamically reconfigurable, allowing the scan test pins to switch between scan testing mode and content delivery mode. This dynamic adaptability enables the same physical pins to perform multiple functions without compromising the performance of either function
3Ease of operation
If unicast technology is used to deliver replicated content to multiple endpoints, then content can be delivered to individual endpoints, but the process is slower compared to parallel delivery to multiple endpoints
Solution Approach 1:
The system dynamically adapts its delivery strategy based on test requirements. For individual endpoint testing or when endpoints require different content variations, unicast provides flexible targeted delivery. For simultaneous testing of identical endpoints, multicast enables high-speed parallel delivery, maximizing productivity
Solution Approach 2:
The content delivery system is segmented into two parallel pathways: unicast for individualized endpoint testing and multicast for bulk identical content delivery. This segmentation allows the system to optimize for either flexibility or throughput depending on the specific test scenario
Data Source
AI summary
Techniques for interface conversion and unicast for test content, firmware, and software delivery are described. An example apparatus comprises a scan test interface coupled to multiple circuits blocks to perform a scan test for the multiple circuit blocks, and circuitry coupled to input/output (IO) signals of the scan test interface to provide content for the multiple circuit blocks and to deliver a replicated content to multiple endpoints of the multiple circuit blocks (e.g., unicast technology). In another example, the circuitry is coupled to the IO signals of the scan test interface and a system/communication interface to decode packets received at the IO signals and convert the decoded packets to provide content through the system/communication interface for the multiple circuit blocks. Other examples are described and claimed.