Scan Island for Automated IC Data Retrieval
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Solution Overview
Problem
Existing methods for retrieving data from integrated circuits (ICs) are inadequate, slow, unsecure, or expensive, making it difficult to diagnose and manage system failures in computing environments.
Innovation Solution
A scalable and secure system for automated data retrieval from ICs, which includes a processing device, a non-transitory storage device, and modules such as a scan island for data extraction, a data security module for authorization and encryption, and a data compression module for efficient storage and transmission.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional methods (RAS records) are used for data retrieval, then the system is simple to implement, but the data retrieval is inadequate and slow
Solution Approach 1:
The IC is divided into multiple scan chains and RAMs, with a dedicated scan island isolated for data retrieval operations. This segmentation allows parallel extraction of data from multiple locations simultaneously, significantly improving retrieval speed while keeping the overall system architecture manageable through modular organization.
Solution Approach 2:
A scan island is pre-configured and isolated within the IC specifically for data retrieval operations. This preliminary setup enables rapid data extraction when trigger events occur, as the infrastructure is already in place and ready for immediate use, avoiding the need for complex on-demand system assembly.
2Reliability
If data is extracted from IC without security measures, then the retrieval process is fast and simple, but data security and confidentiality are compromised
Solution Approach 1:
A data security module is introduced as an intermediary component between the scan island and external systems. This module handles authentication, authorization, and data protection operations, enabling secure data retrieval without requiring security functionality to be embedded throughout the entire IC architecture, thus balancing security with complexity.
3Productivity
If all data is extracted from IC, then complete crash analysis is achieved, but data size and transmission time increase
Solution Approach 1:
Different portions of the IC are organized into scan chains with varying exposure permissions and data sensitivity levels. The system can selectively extract data from specific scan chains and RAMs based on the trigger event type and analysis requirements, extracting only the necessary data portions rather than all data, thereby reducing volume while maintaining extraction speed.
4Reliability
If existing solutions (BMCs) are used in server farms, then data retrieval capability is provided, but security vulnerabilities and cost increase
Solution Approach 1:
The data retrieval and security functions are extracted from external systems like BMCs and embedded directly into the IC through the scan island and data security module. This eliminates the need for separate BMC infrastructure, reducing overall system complexity and removing security vulnerabilities associated with external controllers while maintaining secure data retrieval capabilities.
Data Source
AI summary
Systems, computer program products, and methods are described herein for automated data retrieval from an integrated circuit (IC). An example system extracts, using a scan island (e.g., a partition of the IC that is isolated for data retrieval), data from a plurality of scan chains and a plurality of random-access memories (RAMs) associated with the IC in response to a trigger event associated with the IC; determines, using a data security module associated with the scan island, whether the one or more users are authorized to access the respective portions of the data; and transmits the one or more portions of the data to the one or more users upon verification of their authorization.