Scan Island for Automated IC Data Retrieval
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Solution Overview
Problem
Existing methods for diagnosing and managing system failures in integrated circuits (ICs) within data centers and portable devices are inadequate, slow, unsecure, or expensive, making it difficult to effectively understand and address crashes and malfunctions.
Innovation Solution
A scalable and secure method for automated data retrieval from an integrated circuit (IC) using a scan island, which includes a data extraction module, a clock and reset module, and a data security module, to extract and secure data in response to trigger events such as IC malfunctions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Difficulty of detecting and measuring
If traditional methods (RAS records) are used for crash analysis, then the system is simple to implement, but the diagnostic capability is inadequate and slow
Solution Approach 1:
The patent divides the IC into a scan island (partition) that is isolated from the main IC for dedicated data retrieval operations. This segmentation allows the scan island to perform diagnostic functions independently without affecting the main IC operation, thereby improving crash diagnosis capability while maintaining relative system simplicity.
Solution Approach 2:
The scan island acts as an intermediary component between the main IC and external diagnostic systems. It extracts data from scan chains and RAMs, buffers it in non-volatile memory, and makes it available for analysis without requiring direct complex interactions with the main IC, thus enhancing diagnostic capability with moderate complexity increase.
2Difficulty of detecting and measuring
If BMC is used in server farms for crash analysis, then the diagnostic capability is improved, but security vulnerabilities arise
Solution Approach 1:
The scan island performs self-contained data extraction and storage operations within the isolated partition. It autonomously extracts data from scan chains and RAMs, stores it in non-volatile memory, and makes it available for analysis without requiring external BMC intervention, thereby maintaining enhanced diagnostic capability while eliminating the security vulnerabilities associated with BMC-based systems.
3Speed
If data extraction is performed without isolation, then the retrieval speed is fast, but data security and confidentiality are compromised
Solution Approach 1:
The patent segments the IC into an isolated scan island partition that is physically separated from the main IC. This isolation ensures that data extraction operations occur in a secure, controlled environment without risk of data leakage or interference with the main IC, thereby maintaining fast retrieval speeds while enhancing data security and confidentiality.
Solution Approach 2:
The scan island extracts and buffers data in non-volatile memory within the isolated partition before making it available for analysis. This extraction and buffering mechanism allows fast data retrieval while the isolation barrier ensures data security, as the extracted data remains contained within the secure scan island environment.
4Loss of information
If comprehensive data extraction is performed, then the diagnostic information is complete, but the time required for data retrieval increases
Solution Approach 1:
The scan island continuously extracts and buffers diagnostic data from scan chains and RAMs in the background, preparing it for analysis before crashes occur. This preliminary action ensures that when a crash happens, the data is already ready for immediate analysis, thereby maintaining information completeness while reducing the time required for post-crash data retrieval.
Solution Approach 2:
The scan island operates continuously to extract and buffer diagnostic data from the IC, maintaining an ongoing process of data collection rather than performing extraction only when needed. This continuous operation ensures that diagnostic information is always available and reduces the time required for data retrieval during actual crash analysis, while maintaining complete diagnostic information.
Data Source
AI summary
A scan island for automated data retrieval from an integrated circuit (IC) includes a data extraction module configured to extract data from multiple scan chains and random-access memory (RAM) modules in response to a trigger event, storing the data in an external non-volatile storage medium. The scan island further comprises a clock and reset module, which includes a free-running independent clock to enable continuous operation of the scan island upon occurrence of the trigger event, and a local reset module that re-initializes the scan island in a known state following the trigger event without external intervention. The scan island operates as an isolated partition within the IC, ensuring secure and autonomous data retrieval and recovery processes.