3D Scan-Line Pattern Decoding With Marker-Line Motion Correction

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Solution Overview

Problem

Intraoral scanners generate inaccurate three-dimensional images due to user-induced shaking, leading to poor image decoding accuracy.

Innovation Solution

An image processing method and system that projects scan-line and marker-line patterns onto an object, using a projection light source, pattern generator, and imaging unit to generate and project scan-line patterns, and utilizes marker-line patterns to enhance the accuracy of three-dimensional image generation by aligning and adjusting line widths and sequences.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the scanner is moved quickly to improve scanning efficiency, then productivity increases, but measurement precision deteriorates due to hand shaking and displacement

Engineering Contradiction:
Improvescanning efficiencyVSAvoidimage decoding accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

Marker-line patterns are introduced as intermediary reference elements that mediate between the projected scan-line patterns and the object surface. These marker-lines serve as stable reference markers that remain detectable even when the scanner moves quickly, allowing the system to maintain measurement precision during high-speed scanning by providing fixed reference points for alignment and decoding correction

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system implements feedback by detecting the actual positions of marker-line patterns in the reflected light and using this information to correct decoding errors. The control unit compares the expected marker-line positions with actual detected positions, calculates displacement deviations, and applies corrections to the three-dimensional image reconstruction process, thereby maintaining accuracy despite scanner movement

Inventive Principle:
Principle #23Feedback

2Measurement precision

If the projection period is extended to improve pattern recognition accuracy, then measurement precision improves, but loss of time increases

Engineering Contradiction:
Improvepattern recognition accuracyVSAvoidprojection period
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

Marker-line patterns are projected simultaneously with or before the scan-line patterns to establish reference positions in advance. This preliminary action of marking reference positions allows the system to quickly identify and align scan-line patterns during the projection period, improving pattern recognition accuracy without requiring an extended projection time

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The projection period is segmented into distinct phases: marker-line projection phase and scan-line projection phase. By dividing the projection process into segments with different functions, the system can efficiently allocate time for each task, maintaining high pattern recognition accuracy while minimizing total projection time through optimized phase sequencing

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Improves the accuracy of recognizing and decoding reflected line patterns, resulting in higher quality three-dimensional images by using marker-line patterns to accurately locate scan-lines.

Implementation Method 1

a projection light source, used to generate projection light

Methodology Applied
Scientific EffectLight emission: Light

Implementation Method 2

to receive the first scan-line pattern to the I-th scan-line pattern reflected by the object

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS20260020942A1Image processing method and image processing system for detecting an object using marker-line patterns and scan-line patterns
Publication Date: 2026.01.22 QISDA CORP
  • US20260020942A1 patent drawing
  • US20260020942A1 patent drawing
  • US20260020942A1 patent drawing

AI summary

An image processing method includes performing a coding operation to generate a first code to a W-th code according to W regions of a pattern generator; generating a first scan-line pattern to an I-th scan-line pattern, where the first scan-line pattern to the I-th scan-line pattern includes multiple scan-lines, and each scan-line is corresponding to one of the first code to the W-th code; projecting the first scan-line pattern to the I-th scan-line pattern onto an object within a first predetermined period; and generating a three-dimensional image of the object according to the first scan-line pattern to the I-th scan-line pattern reflected by the object. A duration of projecting and exposing the first scan-line pattern to the I-th scan-line pattern onto the object is a first operating period, and the first predetermined period is less than 110% of the first operating period.