Scan Line Segmentation and Auxiliary Pattern for Display Repair
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Solution Overview
Problem
In bilateral synchronous driving circuits for flat panel displays, defects in one side of the driving circuit can cause abnormal voltage differences, leading to large current returns that damage the control board, resulting in increased production costs due to the inability to promptly identify and repair defective panels.
Innovation Solution
The active device array substrate design includes a substrate with a first and second gate driving circuit, scan line structures, and an auxiliary pattern, where the scan lines are separated by gaps, allowing for disconnection and rerouting of defective scan lines to prevent voltage differences and enable repair by connecting conductors between the auxiliary pattern and terminal ends, ensuring the second gate driving circuit can drive both scan lines, thus preventing damage to the control board.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If bilateral synchronous driving circuit is used to reduce device size and RC delay, then driving efficiency is improved, but the risk of large current return damaging control board increases when defects occur
Solution Approach 1:
The scan line structure is divided into two separate scan lines (first scan line and second scan line) that are physically separated by a gap. This segmentation prevents current from returning through the control board when a defect occurs in one of the driving circuits, as the gap interrupts the current path.
Solution Approach 2:
An auxiliary pattern is introduced as an intermediary element positioned at the gap between the first and second scan lines. This auxiliary pattern serves as a connection point that allows one scan line to be rerouted to the other side when a defect occurs, enabling repair while maintaining the protective gap structure.
2Object-affected harmful factors
If gap is introduced between scan lines to prevent current return, then control board protection is improved, but scan line structure complexity increases
Solution Approach 1:
The auxiliary pattern serves multiple functions: it acts as a structural element defining the gap, provides a connection point for potential rerouting, and serves as an overlap region for both scan lines. This multi-functionality reduces the need for additional separate components.
Solution Approach 2:
The auxiliary pattern is positioned in a spatial overlap region between the first and second scan lines, utilizing the vertical dimension to create the gap structure. This dimensional approach allows the gap to be formed without adding horizontal complexity to the scan line routing.
3Loss of time
If defect positions cannot be determined quickly, then repair time is extended, but production cost increases due to discarding defective panels
Solution Approach 1:
The gap and auxiliary pattern are pre-configured in the scan line structure during manufacturing, before any defects occur. This preliminary preparation enables rapid repair by simply disconnecting the defective scan line from its driving circuit and reconnecting it through the auxiliary pattern to the other side, without requiring complex defect location or custom repair procedures.
4Area of stationary object
If same scan line is driven by two sets of multi-stage shift registers, then device size is reduced, but voltage difference control becomes difficult when one side has defects
Solution Approach 1:
The single scan line is segmented into two separate scan lines (first scan line and second scan line) with a physical gap between them. This segmentation allows each scan line to be independently controlled by its respective driving circuit, preventing uncontrolled voltage differences when one side has defects.
Solution Approach 2:
The auxiliary pattern is positioned locally at the gap region between the two scan lines, creating a localized connection point. This local quality approach allows voltage control to be maintained at the critical gap region while keeping the rest of the scan lines simple and independent.
Data Source
AI summary
An active device array substrate includes a substrate, a first gate driving circuit, a second gate driving circuit, active devices, scan line structures and data lines. The substrate has an active region, a first peripheral region and a second peripheral region. The first and the second gate driving circuits are respectively located at the first and the second peripheral regions. Active device are arranged in an array at the active region. Each scan line structure includes a first scan line, a second scan line and an auxiliary pattern. The first scan line having a first terminal end and the second scan line having a second end are connected to a same row of the active devices respectively. A gap is between the first terminal end and the second terminal end. The auxiliary pattern is disposed on the gap and overlaps the first terminal end and the second terminal end.