Optical Scanner Control Correction for Laser Scanning Microscopes
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Solution Overview
Problem
Existing optical scanner control methods in imaging devices, such as laser scanning microscopes, suffer from inaccuracies at high scanning speeds due to distortion in control signals and phase differences, leading to image distortion and deviations from the intended path, especially due to scanner electronics and mirror deformations.
Innovation Solution
A method and device that correct the control of an optical scanner by using a reference sample with predefined structures to detect deviations in actual positions and adjust the transfer function or control parameters, ensuring precise alignment and movement of the scanner beam path, thereby reducing deviations and achieving accurate image acquisition.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If electronic processing of check-back signal is used for position detection, then position feedback is available, but signal distortion and phase differences occur leading to control inaccuracy
Solution Approach 1:
The patent replaces electronic signal processing with an optical measurement system. A test beam is directed through the scanner along the beam path, and its actual position is detected optically on a detection device. This optical method avoids the signal distortion and phase differences inherent in electronic processing, providing accurate position feedback without the harmful electronic interference.
Solution Approach 2:
The patent introduces a test beam as an intermediary to transfer information about the scanner's actual position. Instead of directly processing electrical check-back signals, the test beam physically traverses the scanner mechanism and carries position information optically to the detection device, serving as a mediator that bypasses the problematic electronic signal path.
2Productivity
If high scanning speed is used to improve productivity, then image distortion and path deviations increase due to scanner electronics and mirror deformations
Solution Approach 1:
The patent implements a feedback loop where the actual position of the test beam after passing through the scanner is continuously detected and compared with the target position. The deviations are used to calculate correction values that are applied to the control signals, enabling real-time compensation for speed-related distortions and maintaining image accuracy even at high scanning speeds.
Solution Approach 2:
The patent performs preliminary optical calibration by measuring the actual beam path through the scanner at different positions and speeds. Correction values are pre-calculated and stored, allowing the system to compensate for scanner nonlinearities and deformations before actual imaging occurs, ensuring accuracy is maintained even when operating at high speeds.
3Manufacturing precision
If optical calibration is performed to improve image accuracy, then pixel positions match target positions at low speeds, but linearity deteriorates at higher scanning speeds
Solution Approach 1:
The patent transitions from static calibration (performed once at low speeds) to dynamic calibration that accounts for varying scanning speeds. The system measures and corrects beam position deviations at multiple speed levels, creating speed-dependent correction values. This allows the calibration to adapt to the dynamic operating conditions, maintaining linearity across the full range of scanning speeds.
4Manufacturing precision
If scanner control is corrected using reference sample imaging, then beam path alignment is improved, but measurement and detection complexity increases
Solution Approach 1:
The patent uses a reference sample with structures that produce distinct optical signals (analogous to color changes) at known positions. These structures reflect or emit light in a way that creates easily distinguishable detection patterns, allowing automated image processing algorithms to quickly and accurately identify beam position deviations without complex measurement setups.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for accurate guidance of the scanner beam path, minimizing image distortion and ensuring precise alignment, enabling high-speed scanning with minimal deviations from the target movement, thus producing undistorted images with improved precision and reduced fluctuations in sample illumination.
Implementation Method 1
a beam deflecting element that is movable in relation to the device... For deflection of the laser beam to a predefined position of the sample and for deflection of the detection radiation emitted from the focus onto the acquisition unit, a deflection device is used
Data Source
AI summary
Method for correcting control of an optical scanner in a laser scanning microscope for imaging of a sample by scanning, the microscope guiding at least one beam path section of an illumination beam path of the microscope over the sample from an illumination device to the sample and/or an imaging beam path of the microscope from the sample to an acquisition device of the microscope in order to obtain an image of the sample, generating control signals corresponding to a predefined target movement using parameters and/or a transfer function of the scanner that are used for control and/or regulation and moving the at least one beam path section in response to the control signals, whereby an image of a reference sample having predefined structures imageable by the microscope is obtained by generating control signals corresponding to a predefined target test movement and moving the at least one beam path section in response to the control signals, thereby obtaining the image. From the image thereby obtained, a deviation in the actual positions of the predefined structures of the reference sample from the predefined target positions is determined and the transfer function or parameters are corrected as a function of the deviations at least one of the parameters used for control and/or regulation, so that when using the corrected parameter for control or regulation and/or when using the corrected transfer function, the deviation in the actual position of at least one of the structures from the target position of the structure is reduced.