Scanner Closed-Loop Control Using Frequency-Space Error Correction

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Solution Overview

Problem

Conventional closed-loop control systems for scanners, such as those used in laser scanning microscopes, face challenges in achieving high accuracy and reliability due to system deviations between the target and actual poses of the deflection unit, leading to image distortions and double contours.

Innovation Solution

A method for closed-loop control that involves receiving an input signal indicative of the system deviation, expanding it into error components at various frequencies, determining correction signal components based on frequency response components, and outputting a control signal to correct these deviations, allowing for precise control of the scanner's pose.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional PID controllers are used for closed-loop control, then the control system is simple to implement, but the accuracy and reliability are insufficient due to uncorrected system deviations

Engineering Contradiction:
Improvescanning angle accuracyVSAvoidcontrol system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the error signal into multiple frequency components using Fourier transformation. Each frequency component is processed independently through separate correction channels, allowing targeted correction of different types of deviations (periodic errors, harmonics, etc.) while maintaining overall system manageability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transforms the control problem from the time domain to the frequency domain. By analyzing and correcting errors in the frequency dimension rather than directly in time, the system achieves higher precision correction of scanning angle deviations without proportionally increasing time-domain control complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If frequency-space analysis is implemented to correct all error components, then the scanning accuracy is significantly improved, but the computational complexity and processing time increase

Engineering Contradiction:
Improvescanning curve accuracyVSAvoidcontrol processing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent implements partial correction by focusing on the most significant frequency components (fundamental frequency and major harmonics) rather than attempting to correct all frequency components with equal detail. This selective approach achieves substantial accuracy improvement while limiting computational overhead

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The patent performs preliminary Fourier transformation and frequency component identification before the main correction process. By pre-processing the error signal to identify dominant frequency components, the system prepares correction data in advance, reducing real-time processing demands during actual scanning operations

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11036038B2Closed-loop control of a scanner with frequency-space analysis of a system deviation
Publication Date: 2021.06.15 CARL ZEISS MICROSCOPY GMBH
  • US11036038B2 patent drawing
  • US11036038B2 patent drawing
  • US11036038B2 patent drawing

AI summary

The invention is based on the object of providing a particularly reliable closed-loop control for a scanner. According to various examples, this object is achieved by an analysis of a system deviation in the frequency space. By way of example, an input signal, which is indicative of a time dependence of the system deviation between an ACTUAL pose and a TARGET pose of a deflection unit of the scanner, can be expanded into a multiplicity of error components and a plurality of frequencies. Then, a corresponding correction signal component can be determined for each of the multiplicity of error components. By way of example, such techniques can be used in a laser scanning microscope.