3D Scanner Patterned Probe Light Shifting
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Solution Overview
Problem
Conventional 3D scanners require multiple light sources and are unable to gradually shift the pattern position on the object, which limits their ability to record accurate 3D topography without interference from the pattern light.
Innovation Solution
A 3D scanner design that includes an illumination unit with a patterned probe light and an optical system with a motorized rotation stage, allowing the optical element to change configuration between two orientations, thereby shifting the pattern position smoothly and dynamically on the object.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If two light sources are used to provide transmitted and reflected light patterns, then the pattern illumination is achieved, but the device complexity increases
Solution Approach 1:
The patent combines transmitted and reflected light paths into a single optical path by using a beam splitter to merge the light from one light source that has been transmitted through the mask with light reflected from the mask, allowing both illumination modes to be achieved with a single light source rather than requiring two separate light sources
Solution Approach 2:
The single light source is designed to serve multiple functions by providing both transmitted light illumination (through the mask) and reflected light illumination (from the mask) sequentially or simultaneously, making the light source universal for both illumination modes that traditionally required separate dedicated light sources
2Stability of the object's composition
If a fixed pattern mask is used, then the pattern structure is stable, but the pattern position cannot be shifted on the object
Solution Approach 1:
The patent introduces a movable mask that can be shifted along the optical axis relative to the object while maintaining its structural integrity, allowing the pattern position to be dynamically adjusted between different depths or focal planes without changing the mask's inherent pattern structure, thus achieving both stability and adaptability
3Measurement precision
If the pattern light is projected onto the object, then the 3D topography can be recorded, but the pattern interferes with the texture recording
Solution Approach 1:
The patent employs periodic modulation of the pattern light intensity or projection timing, where the pattern is projected in alternating intervals with periods when no pattern is projected, allowing the imaging sensor to capture both patterned images for 3D topography and unpatterned images for texture recording at different time points, thus preventing pattern interference with texture information
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the recording of 3D topography with reduced pattern interference, allowing for continuous and precise control of the pattern position, improving the accuracy and resolution of texture recording without the need for multiple light sources.
Implementation Method 1
an optical system with a motorized rotation stage, allowing the optical element to change configuration between two orientations, thereby shifting the pattern position smoothly and dynamically on the object
Data Source
Figure 1A~1B
Figure 2~3
Figure 4A~4B
AI summary
Disclosed is a 3D scanner for recording the 3D topography of an object, the 3D scanner comprising: - an illumination unit configured for providing probe light for illuminating the object, where the probe light comprises a pattern of light rays; - an image sensor for acquiring one or more 2D images of light rays returning from the illuminated object; - an optical system comprising an optical element arranged such that the patterned probe light passes through it when propagating towards the object from the illumination unit along an optical path; and - a device for changing the configuration of the optical system between a first and a second configuration, where the change in configuration comprises a change in orientation of the optical element between a first orientation and a second orientation relative to the optical path of the probe light such that the change of configuration provides a shift in the position of the probe light pattern on the illuminated object.