Scanner Substrate Surface Detection via Optical Intermediary
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current systems for detecting substrate surfaces within scanners lack efficiency and accuracy, particularly in isolating target analytes from substrates such as well plates or slides, which hinders precise detection and analysis of biological samples.
Innovation Solution
A scanner system equipped with a picker tip and a position detection system that uses a z-picker motor system to locate and detect substrate surfaces by calculating differences in output voltage, allowing for precise positioning and isolation of target analytes through controlled movement and vibration, enabling accurate detection and isolation of biological materials on various substrates.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a picker system is used to isolate target analytes from substrates, then the ability to process biological samples is improved, but the accuracy and efficiency of substrate surface detection deteriorates
Solution Approach 1:
The patent introduces an optical detector as an intermediary component that indirectly detects substrate surfaces through light interaction. The detector uses light sources and sensors to measure substrate position and characteristics without mechanical contact, resolving the conflict between mechanical picking operations and detection accuracy by separating the detection function from the picking mechanism.
Solution Approach 2:
The patent replaces mechanical detection methods with optical detection systems. Instead of using mechanical sensors that physically contact the substrate, the system employs optical fields (light sources and detectors) to sense substrate position and properties, eliminating mechanical interference and improving measurement precision while maintaining productivity.
2Measurement precision
If substrate detection systems are made more complex to improve detection accuracy, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent implements a multi-functional optical detection system where a single integrated detector assembly performs multiple functions: substrate position detection, surface characteristic analysis, and coordination with the picker system. This universal detector reduces overall system complexity by consolidating multiple specialized components into one versatile unit that handles various detection tasks.
Data Source
AI summary
This disclosure is directed to a system and method for detecting a surface of a substrate within a scanner.