Scanning Beam Device Calibration Using Image Pattern Comparison
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Solution Overview
Problem
Scanning beam devices face positional inaccuracies due to environmental, manufacturing, and electronic imperfections, leading to image distortion, especially when operating near resonance frequencies, and existing calibration methods using photosensitive position sensors are costly, limited in field of view, and prone to stray light interference.
Innovation Solution
A method and apparatus for calibrating scanning beam devices by acquiring and comparing images of a calibration pattern with a representation of the expected scan pattern, adjusting drive signals and pixel positions to account for differences between actual and expected positions, without the need for photosensitive position sensors, using a photodetector and image generation logic to generate images at expected positions and calibrate the device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If photosensitive position sensors are used for calibration, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent uses a camera to capture an image of the calibration pattern as a copy of the actual beam positions, comparing it with the expected scan pattern representation. This replaces complex photosensitive position sensors with a simpler imaging system that achieves the same calibration objective through image processing rather than direct optical sensing.
Solution Approach 2:
The patent replaces the mechanical/optical photosensitive position sensor system with a digital imaging and image processing system. The camera captures positions visually, and software algorithms compare the captured image with the expected pattern to determine calibration corrections, eliminating the need for specialized photosensitive sensors.
2Measurement precision
If photosensitive position sensors are used for calibration, then measurement precision is improved, but manufacturing cost increases
Solution Approach 1:
The patent uses a standard camera to capture an image of the calibration pattern, creating a visual copy of beam positions that can be processed digitally. This approach uses off-the-shelf imaging components rather than specialized photosensitive sensors, significantly reducing manufacturing cost while maintaining calibration precision.
Solution Approach 2:
The patent employs a standard camera and digital image processing instead of expensive, specialized photosensitive position sensors. The calibration pattern itself can be a simple, inexpensive physical target that doesn't need to be durable, as it only needs to be visible to the camera for the calibration process.
3Measurement precision
If photosensitive position sensors are used for calibration, then measurement precision is improved, but field of view is limited
Solution Approach 1:
The patent transitions from point-by-point position sensing (1D or limited 2D) to a full 2D image capture approach. The camera captures the entire calibration pattern field of view simultaneously in an image, allowing calibration across a much larger area without being constrained by sensor array limitations.
Solution Approach 2:
The camera-based system serves multiple functions: it captures the entire field of view, records beam positions, and provides visual documentation. A single camera component replaces multiple specialized sensors, achieving both wide field of view and precise position measurement through its imaging capability.
4Measurement precision
If photosensitive position sensors are used for calibration, then measurement precision is improved, but susceptibility to stray light increases
Solution Approach 1:
The patent uses a camera to capture a visual copy of the calibration pattern and beam positions. Standard camera sensors are less susceptible to stray light interference compared to specialized photosensitive position sensors, and the image processing algorithms can filter out stray light effects by looking for the specific calibration pattern features rather than raw optical signals.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces image distortion by accurately accounting for positional differences, improving image quality without the drawbacks of photosensitive position sensors, such as cost and limited field of view, and simplifies the calibration process.
Implementation Method 1
scanning a cantilevered optical fiber in a scan pattern including moving the cantilevered optical fiber within a Q factor of a resonant frequency of the cantilevered optical fiber
Implementation Method 2
a photodetector to detect light backscattered from the calibration pattern at different times during the scan pattern
Data Source
Figure 1
Figure 2
Figure 3~4
AI summary
Scanning beam device calibration using a calibration pattern is disclosed. In one aspect, a method may include acquiring an image of a calibration pattern using a scanning beam device. The acquired image may be compared with a representation of the calibration pattern. The scanning beam device may be calibrated based on the comparison. Software and apparatus to perform these and other calibration methods are also disclosed.