Scanning Beam Illumination for Laser Microscopy
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Solution Overview
Problem
Existing methods for generating images using structured illumination in laser microscopy face limitations such as inflexibility, low modulation depth, and reduced illumination intensity, particularly when achieving high resolution and non-linear sample interactions.
Innovation Solution
A device and method where a light beam is moved over an object with synchronized intensity modulation to create a pattern, allowing for complete modulation and maximized illumination intensity, enabling efficient generation of depth-discriminated optical sections through diffraction-limited focusing and periodic pattern creation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If gratings or diffractive optical elements are used to structure illumination, then structured illumination is achieved, but the system becomes inflexible requiring multiple components for different patterns
Solution Approach 1:
The patent extracts the structuring function from fixed optical elements (gratings, diffractive elements) and transfers it to a scanning light beam system. By removing the need for physical structuring components and using a movable beam with temporal modulation, the system achieves pattern flexibility without requiring multiple optical components for different illumination patterns.
Solution Approach 2:
The patent replaces mechanical/optical structuring elements (gratings, diffractive optical elements) with a scanning beam mechanism combined with temporal intensity modulation. This substitution eliminates the need for physical structuring components while achieving the same illumination patterning effect through coordinated beam movement and intensity control.
2Measurement precision
If structuring is performed near the cut-off frequency to increase resolution, then resolution improves, but modulation depth and illumination efficiency decrease
Solution Approach 1:
The patent applies periodic temporal modulation to the scanning light beam intensity, synchronized with the beam's periodic scanning motion. This periodic action in the time domain compensates for the reduced modulation depth at high spatial frequencies, maintaining effective illumination intensity even when operating near the cut-off frequency for enhanced resolution.
Solution Approach 2:
The patent changes the temporal intensity parameter of the light beam during scanning, modulating the intensity synchronously with the beam movement. This parameter change in the time domain allows the system to maintain high effective illumination intensity and modulation depth even when using fine spatial structuring near the optical cut-off frequency.
3Measurement precision
If low illumination intensity is used for high resolution structuring, then resolution is improved, but non-linear sample interactions become difficult to achieve
Solution Approach 1:
The patent employs periodic temporal intensity modulation synchronized with the scanning beam, concentrating illumination energy at specific moments during the scan cycle. This periodic concentration of energy allows non-linear sample interactions to occur during high-intensity phases while maintaining overall fine spatial structuring for high resolution, effectively decoupling the intensity requirement for non-linear interactions from the spatial frequency requirement for resolution.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables full modulation depth and maximized illumination intensity, facilitating efficient image generation and three-dimensional representation, especially in laser scanning microscopy, with the ability to quickly adapt to changes in optical elements and enhance resolution.
Implementation Method 1
the illumination module moves a light beam over the object and modulates its intensity synchronously with the movement in such a way that the beam generates the pattern by scanning
Implementation Method 2
The maximization can be achieved in particular by carrying out diffraction-limited focusing
Implementation Method 3
the sample radiation is the radiation that is generated by the interaction of the light beam focused on or into the sample and moved across the sample with the sample
Data Source
Figure 1
AI summary
A device for generating an image of an object is provided, comprising an illumination module (1), by means of which the object can be illuminated with a pattern whose phase is altered temporally, a recording module (4), by means of which a plurality of recordings of the object are carried out during the phase change of the pattern, and a processing module (5), which generates the image from the recordings, wherein the illumination module (1) moves a light beam (S1) over the object and modulates its intensity synchronously with the movement such that the beam generates the pattern in scanning fashion.