Scanning Circuit Life Extension via Periodic Off-Voltage Switching

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Solution Overview

Problem

Scanning circuits with single conductive type thin film transistors face significant challenges in extending circuit life due to fluctuation in transistor properties caused by electric stress, as existing solutions increase gate voltage to compensate, leading to greater electric stress and further fluctuation, thereby insufficiently extending circuit life.

Innovation Solution

The electronic circuit design includes multiple switching-target circuits and switching circuits that switch between operating and stop states based on property fluctuation, with the switching circuit applying off-voltage to maintain the initial-to-stop state and switching the circuit to an operating state by property fluctuation, reducing electric stress on transistors and minimizing threshold voltage shift.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If gate voltage is increased to compensate for transistor property fluctuation, then circuit functionality is maintained, but electric stress increases causing greater threshold voltage shift and reduced circuit life

Engineering Contradiction:
Improvecircuit functionalityVSAvoidcircuit life
Core Design Contradiction:
ReliabilityVSDuration of action of moving object

Solution Approach 1:

The invention applies periodic switching between operating and stop states to the pulldown circuit. By periodically stopping the circuit operation and applying off-voltage to the transistor gate, the transistor experiences reduced electric stress during stop periods, which minimizes cumulative threshold voltage shift and extends circuit life while maintaining functionality during operating periods

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The invention applies off-voltage to the transistor gate in advance during the stop state, before significant property fluctuation occurs. This preliminary application of off-voltage prevents the transistor threshold voltage from shifting excessively, thereby extending circuit life before functionality degradation occurs

Inventive Principle:
Principle #10Preliminary action

2Duration of action of moving object

If switching circuit is added to manage operating and stop states, then circuit life is extended, but circuit complexity increases

Engineering Contradiction:
Improvecircuit lifeVSAvoidcircuit structure
Core Design Contradiction:
Duration of action of moving objectVSDevice complexity

Solution Approach 1:

The invention merges the switching circuit with the existing display device driver circuitry. The switching circuit shares common elements such as power supply connections, transistor structures, and control signal lines with the pulldown circuit, thereby extending circuit life without proportionally increasing overall circuit complexity

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The switching circuit is designed to perform multiple functions: it controls the transition between operating and stop states, applies off-voltage to extend transistor life, and can be integrated with existing display driving functions. This multi-functionality reduces the need for separate dedicated components, limiting complexity increase

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS10074326B2Electronic circuit, scanning circuit, display device, and electronic circuit life extending method
Publication Date: 2018.09.11 TIANMA MICRO ELECTRONICS CO LTD
  • US10074326B2 patent drawing
  • US10074326B2 patent drawing
  • US10074326B2 patent drawing

AI summary

To provide an electronic circuit and the like capable of extending the life greatly even when the transistors constituting the electronic circuit have property fluctuation. The electronic circuit includes switching-target circuits and a switching circuit for switching the switching-target circuits to an operating state from a stop state. The switching-target circuits include the switching-target circuit in an operating state and the switching-target circuit in an initial-to-stop state. Property fluctuation is generated in the transistors forming the switching-target circuits and the switching target due to an electric stress applied to the transistors. The switching circuit switches the switching-target circuit in the initial-to-stop state to an operating state by the transistor of the switching circuit.