Scanning Driving Circuit High-Temperature Reliability

The patent combines multiple control functions into integrated modules. The pull-down control module integrates control signals for both pull-down transistors, and the reset module integrates control signals for both reset transistors. This merging of functions reduces the overall number of separate control components while maintaining full scanning control capability, thereby simplifying the structure and improving reliability at high temperatures.

The scanning driving circuit is designed with universal control modules that can handle both forward and backward scanning operations. The pull-down control module and reset module are configured to work with both previous-stage and next-stage scanning signals, making the circuit structure multi-functional and adaptable to different scanning directions without requiring separate dedicated circuits for each function.

The patent implements preliminary anti-action by introducing a dedicated reset module that actively counteracts leakage effects before they significantly impact circuit performance. The reset transistors and associated control circuits are designed to periodically reset the scanning lines, preventing accumulation of leakage charges that would otherwise cause delay and reliability problems at high temperatures.

The circuit design incorporates parameter optimization for high-temperature operation by selecting transistor characteristics and capacitor values that maintain proper voltage levels and timing under thermal stress. The bootstrap capacitors are sized to maintain sufficient voltage swing, and the transistor threshold voltages are selected to ensure proper switching behavior at elevated temperatures, thereby reducing delay and leakage effects.