Scanning Illumination Microscope Parallel Beam Array
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Solution Overview
Problem
Conventional microscopes face challenges in achieving both wide field view and high-resolution images simultaneously due to the limited field of view of high-resolution objective lenses, requiring time-consuming sample stage translation.
Innovation Solution
A microscope system featuring a beam array generator and corresponding sensor array, where each light beam corresponds to a unique sensor pixel, enabling raster scanning to capture high-resolution images with a wide field-of-view through a one-to-one correspondence, allowing for simultaneous and dynamic imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a high-resolution objective lens is used, then image resolution is improved, but field of view is limited
Solution Approach 1:
The patent divides the imaging system into multiple parallel beam paths, each corresponding to a specific sensor pixel. Each beam independently scans the sample to cover its designated pixel area, enabling simultaneous high-resolution imaging across multiple fields of view through parallel processing
Solution Approach 2:
The patent introduces a temporal dimension to the imaging process by raster-scanning beams across the sample in a coordinated manner. This allows the system to achieve wide field of view by sweeping through multiple spatial positions while maintaining high resolution through the one-to-one correspondence between beams and pixels
2Area of stationary object
If sample stage translation is used to increase field of view, then field of view is improved, but imaging time is increased
Solution Approach 1:
The patent segments the imaging task across multiple beams that operate simultaneously. Each beam is assigned to a specific sensor pixel and scans its designated area in parallel, eliminating the need for sequential translation and significantly reducing total imaging time
Solution Approach 2:
The patent maintains continuous scanning action across all beams simultaneously rather than stopping for translation between frames. The coordinated raster scanning ensures uninterrupted data collection across the entire field of view, maximizing imaging efficiency
Data Source
AI summary
A microscopy method and configuration provides the ability to achieve wide field view and high resolution simultaneously. A beam array generator generates an M×N light beam array that illuminates a sample and an M×N sensor array. The sensor array obtains a whole microscopy image of the sample based on the light beam array. Each light beam of the array corresponds to one unique pixel sensor in the sensor array. A scanning of all light beams of the light beam array covers a whole area of the sample.