Scanning Microscope Digital Circuit for Non-Linear Illumination
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Solution Overview
Problem
Conventional scanning microscopes suffer from non-linearity in illumination due to sinusoidal deflection of the mirror galvanometer, leading to varying cycle times across pixels, resulting in lost valuable measuring time and a worse signal-to-noise ratio, especially at image edges, and require constant integration times that depend on the shortest pixel cycle time.
Innovation Solution
A digital circuit is employed to periodically sum and average detection signals within a pixel, allowing for variable cycle times and independent image brightness from scanning speed and format, while compensating for non-linearity in analog amplification through digital gain adjustment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If analog integration is used with constant maximum time for all pixels, then integration time is uniform across the image, but valuable measuring time is lost for pixels at edges with longer cycle times
Solution Approach 1:
The patent implements dynamic integration time adjustment where the integration time is adapted to match the actual illumination cycle time of each pixel. Instead of using a constant maximum integration time for all pixels, the system varies the integration time dynamically based on the position in the scanning pattern, allowing full utilization of available measurement time for each pixel without waste.
Solution Approach 2:
The system changes the integration time parameter according to the pixel position and scanning characteristics. By adjusting the integration time parameter to match the actual cycle time of each pixel, the system optimizes the use of available measurement time while maintaining signal quality across the entire image.
2Productivity
If integration time is set based on shortest pixel cycle time, then all pixels can be processed uniformly, but signal-to-noise ratio deteriorates at edges with longer cycle times
Solution Approach 1:
The patent employs dynamic integration time adjustment where the integration duration is adapted to match the actual illumination cycle time of each pixel. This dynamic approach allows the system to extend integration time for edge pixels with longer cycle times, thereby improving signal-to-noise ratio without compromising the processing speed determined by the fastest pixels.
Solution Approach 2:
The system varies the integration time parameter based on pixel position and scanning characteristics. By increasing integration time for pixels with longer cycle times and maintaining optimal integration time for central pixels, the system improves measurement precision across the entire image while maintaining overall processing efficiency.
3Speed
If high sampling rates are used to reduce integration time to 25ns, then scanning speed increases, but integrator clearing time becomes comparable to integration time causing incomplete deletion
Solution Approach 1:
The patent replaces the analog integrator clearing mechanism with a digital signal processing approach. Instead of relying on hardware clearing circuits that require finite propagation time, the system uses digital sampling and processing that can be synchronized precisely with the scanning rhythm, allowing complete signal acquisition even at very high scanning speeds.
Solution Approach 2:
The system employs periodic sampling synchronized to the scanning frequency, where detection signals are sampled at specific phases of the scanning cycle. This periodic action allows the system to capture signals during active illumination periods and process them digitally, avoiding the clearing time limitations of analog systems.
4Device complexity
If constant integration time is maintained within a scanned line, then integration process is simplified, but image brightness becomes dependent on scan speed and format requiring user correction
Solution Approach 1:
The patent implements dynamic integration time adjustment that automatically adapts to changes in scan speed and format. By varying the integration time dynamically based on the actual illumination cycle time of each pixel, the system maintains consistent image brightness across different scanning conditions without requiring user intervention or manual correction.
Solution Approach 2:
The system uses feedback from the scanning device to adjust integration time automatically. By monitoring the actual scanning speed and pixel cycle times, the system dynamically adjusts integration parameters to maintain optimal image brightness, eliminating the need for manual user correction when scan parameters change.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances image quality by optimizing measurement time per pixel, reducing noise and digitization errors, and allowing for flexible cycle times that match scanning speed, thereby improving signal-to-noise ratio and dynamic sensitivity.
Implementation Method 1
a photodetector array which receives the light emitted from the object and generates detection signals
Data Source
Figure 1
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Figure 2b
AI summary
A device and a method for detection using a scanning microscope (1) are disclosed. The scanning microscope (1) comprises a scanning unit (7) that guides an illumination light beam (3) through a scanning optic (12) and a microscope optic (13) over or through an object (15). A digital circuit (30) is connected downstream of the detector unit (19), which periodically queries the detection signals within a pixel (Px,y) and calculates an average value from them.