Scanning Probe Microscope Particle-Count Threshold for Faster Analysis
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Solution Overview
Problem
Existing scanning probe microscopes require significant time to complete particle analysis due to the generation of excessive image data beyond the necessary amount for analysis, leading to inefficiency.
Innovation Solution
The scanning probe microscope terminates the acquisition of observation signals when the total number of particle images exceeds a predetermined threshold, allowing for efficient generation of image data within the required limits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the observation device continuously acquires observation signals for all divided regions, then the particle analysis can be performed with sufficient data, but the time required to complete the analysis becomes significantly long
Solution Approach 1:
The invention applies partial action by acquiring observation signals only until a predetermined number of particle images are collected, rather than continuously acquiring signals for all divided regions. The information processing device terminates signal acquisition when the counted total number of particle images reaches the threshold, avoiding unnecessary data collection and reducing analysis time while maintaining sufficient data for accurate particle analysis.
2Area of stationary object
If the observation range is divided into multiple regions, then the scanning range limitation can be overcome, but the amount of image data generated increases excessively
Solution Approach 1:
The invention implements feedback by continuously counting the number of particle images acquired from each divided region and using this count information to determine when to terminate signal acquisition. The information processing device monitors the counted total number of particle images and stops acquiring observation signals when the threshold is reached, preventing excessive data generation while still covering the necessary observation range.
Data Source
AI summary
A scanning probe microscope includes an observation device configured to output an observation signal acquired by observing a sample containing particles, and an information processing device. The information processing device is configured to acquire the observation signal, generate an observation signal based on the observation signal each time the observation signal corresponding to one observation region of the observation device is acquired, count the number of particle images included in the observation image each time the observation image is generated, terminate an acquisition of the observation signal when a counted total number of particle images becomes greater than a predetermined threshold, and execute a particle analysis on a generated observation image.