Scanning Reflective Bright Field Microscope with Multi-LED Illumination
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Scanning reflective bright field microscopes face challenges with frequent Xe lamp replacements and illuminance deficits when using LED illuminators, which affect inspection quality and efficiency.
Innovation Solution
A scanning RBF microscope design incorporating multiple LEDs, a light combiner, a polarizer, a retarder, and a sensor coupling filter, along with a control system to synchronize LED control signals with shutter control signals, to overcome illuminance deficits and eliminate the need for Xe lamps.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If Xe lamps are used for illumination, then high illuminance is achieved, but frequent lamp replacements are required
Solution Approach 1:
The patent changes the illumination source from Xe lamps to multiple high-power LEDs, fundamentally altering the parameter of light source type. This substitution maintains high illuminance output while extending operational lifespan from hundreds of hours to tens of thousands of hours, eliminating frequent replacements
Solution Approach 2:
The patent replaces expensive, short-lived Xe lamps with more economical, long-lived LEDs. Although multiple LEDs are used, their individual longevity and lower replacement cost make this a cost-effective solution that eliminates the disposable nature of Xe lamp operation
2Duration of action of stationary object
If multiple LEDs are used to eliminate Xe lamps, then LED lifespan is extended, but illuminance deficits occur
Solution Approach 1:
The patent combines multiple high-power LEDs (typically 3-9 LEDs) into a single illuminator assembly, merging their collective light output to achieve illuminance levels comparable to Xe lamps. This array configuration ensures sufficient illumination intensity while maintaining the extended lifespan advantage of LEDs
Solution Approach 2:
The patent segments the illumination function across multiple independent LEDs rather than relying on a single source. This segmentation allows each LED to operate within optimal parameters, collectively delivering high illuminance while maintaining system reliability and extended operational life
3Productivity
If scanning microscopy approach is used to achieve high inspection speeds, then settling and stop times are eliminated, but acceleration and deceleration times must be minimized
Solution Approach 1:
The patent implements dynamic scanning where the microscope or specimen moves continuously at constant velocity through the scanning range. This dynamic approach eliminates the need for acceleration and deceleration cycles, maintaining constant speed throughout the inspection process and maximizing inspection throughput
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design extends LED lifespan, reduces illuminance deficits, and maintains high-quality inspection capabilities, addressing the limitations of Xe lamp replacements and illuminance issues in existing systems.
Implementation Method 1
a light combiner to combine light output of the multiple LEDs
Implementation Method 2
a polarizer to receive and split the light output from the light combiner into two polarized portions
Implementation Method 3
a retarder and a sensor coupling filter to receive the first portion of the polarized light and convert the first portion of the polarized light into circularly polarized light
Data Source
Figure 1
Figure 2
Figure 3
AI summary
A scanning reflective bright field microscope for inspection of a specimen is provided. The microscope may include multiple light emitting diodes (LEDs); a light combiner to combine light output of the multiple LEDs; a polarizer to receive and split the light output from the light combiner into two polarized portions, so that a first portion of the polarized light is directed towards the specimen; and a retarder and a sensor coupling filter to receive the first portion of the polarized light and convert the first portion of the polarized light into circularly polarized light directed towards the specimen, and the retarder and the sensor coupling filter converts circularly polarized reflected light from the specimen into linearly polarized light that is directed towards an imaging system.