Scatter Parameter Measurement Probe Positioning

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Solution Overview

Problem

The accuracy and repeatability of measuring scattering parameters in complex planar microwave circuits are compromised due to uneven substrates and oblique positioning of non-contacting probes, making precise positioning challenging.

Innovation Solution

A measuring system with motorized positioners and sensors for precise alignment of probes relative to the electrical device under test, using a control unit to adjust the probes' position based on detected signals, ensuring accurate and repeatable positioning for improved measurement accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If non-contacting probes are used for measuring scattering parameters, then the measuring system can characterize embedded DUTs, but the measurement accuracy deteriorates due to positioning repeatability issues caused by substrate unevenness and oblique probe positioning

Engineering Contradiction:

Improvecapability to characterize embedded DUTsVSAvoidmeasurement accuracy

Core Design Contradiction:

Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent implements feedback control by using sensors (optical, electro-optical, electrical, acoustic, infrared, electrostatic, or magnetic) to detect the actual position of measuring probes and feed this information back to a control unit. The control unit then actuates motorized positioners to adjust probe positions, creating a closed-loop system that compensates for positioning errors caused by substrate unevenness and achieves repeatable positioning accuracy.

Inventive Principle:

Principle #23Feedback

Solution Approach 2:

The patent replaces manual mechanical positioning with an automated system combining sensors and motorized positioners. Instead of relying on operator skill to position probes manually, the system uses sensor feedback and automated motorized adjustment to achieve precise and repeatable probe positioning, eliminating the limitations of manual mechanical positioning.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Device complexity

If manual positioning of measuring probes is used, then the device complexity is low, but the positioning repeatability and measurement accuracy deteriorate

Engineering Contradiction:

Improvesystem simplicityVSAvoidpositioning repeatability

Core Design Contradiction:

Device complexityVSManufacturing precision

Solution Approach 1:

The patent implements self-service positioning where the system automatically detects its own positioning status through sensors and corrects any deviations using motorized positioners. The measuring system characterizes its own performance and self-adjusts to maintain optimal probe positions, eliminating the need for complex external positioning equipment while achieving high repeatability.

Inventive Principle:

Principle #25Self-service

3Measurement precision

If motorized positioners with sensors are added to achieve precise positioning, then measurement accuracy improves, but the device complexity increases

Engineering Contradiction:

Improvepositioning accuracyVSAvoidsystem complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent achieves multi-functionality by integrating multiple sensor types (optical, electro-optical, electrical, acoustic, infrared, electrostatic, or magnetic) that can detect probe position through various physical principles. This universal sensing approach allows the same basic system architecture to handle different positioning challenges and substrate conditions, reducing overall system complexity despite the added functionality.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system achieves high accuracy and repeatability in measuring scattering parameters by enabling precise positioning of probes, minimizing measurement errors caused by substrate unevenness and oblique coupling.

Implementation Method 1

at least one sensor for detecting a position of at least one measuring probe and emitting a position signal... the at least one sensor detecting a position of the at least one measuring probe relative to a position mark on the electronic circuit or the substrate

Methodology Applied

Scientific EffectElectromagnetic radiation detection: Electromagnetic Induction

Data Source

PatentUS9116189B2Measuring system for determining scatter parameters

Publication Date: 2015.08.25 ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO KG

AI summary

A measuring system for determining scatter parameters of an electrical measurement object on a substrate, having a measuring machine having at least one measuring channel and at least one measuring probe electrically connected to at least one measuring channel and designed for non-contacting or contacting connection to an electrical signal line of the electrical measurement in the electronic circuit. A first positioning device is provided for at least one measuring probe, wherein at least one sensor detects a position of at least one measuring probe and outputs a position signal.