Optical Measurement Device Using Scatterer Light Coupling
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Solution Overview
Problem
Existing optical measurement devices using multiplexing of light are unsuitable for analyzing thick samples, as they rely on evanescent coupling, which limits detection to samples thinner than the wavelength of fluorescence light, making it difficult to measure transmission, diffusion, or fluorescence in thick layers.
Innovation Solution
A device employing a forced coupling of light using a light guide with a scatterer to deflect light emitted by thick samples, allowing it to penetrate and be guided perpendicular to the original light axis, enabling detection of light from thicker samples through elastic scattering rather than diffraction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If evanescent coupling is used to couple light from samples to a light guide, then light coupling efficiency is improved for thin samples, but the device becomes unsuitable for analyzing thick samples where light penetration becomes negligible
Solution Approach 1:
The invention changes the coupling mechanism from evanescent coupling to forced coupling using a scatterer. The scatterer is positioned at a distance from the light guide surface (greater than the penetration depth of evanescent waves) and redirects light from thick samples into the light guide through scattering, enabling detection of samples with thicknesses exceeding 10 wavelengths that would otherwise be undetectable with evanescent coupling
Solution Approach 2:
A scatterer is introduced as an intermediary element between the light source/sample assembly and the light guide. This scatterer mediates the light transfer by redirecting light paths that would otherwise not couple efficiently into the light guide, particularly for thick samples where evanescent coupling is insufficient
2Adaptability or versatility
If a scatterer is introduced to enable forced coupling of light from thick samples, then measurement capability for thick samples is improved, but device complexity increases
Solution Approach 1:
The scatterer is positioned locally at a specific distance from the light guide surface (greater than the evanescent wave penetration depth) rather than throughout the entire system. This localized intervention provides the necessary light redirection function without requiring system-wide complexity changes
Solution Approach 2:
The optical system is segmented into distinct functional zones: the light source and sample region, the scatterer region positioned at an optimal distance, and the light guide region. This segmentation allows each component to perform its specific function independently, simplifying the overall system design despite the added scatterer element
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables optical measurements on thicker samples by increasing the amount of light that can be detected, overcoming the limitations of evanescent coupling and improving measurement accuracy for thick layers.
Implementation Method 1
the said scatterer can cause a proportion of the light emitted by the dot to penetrate into the said light guide, such that it is guided in a direction perpendicular to the axis of the light emitted by the said light source
Data Source
AI summary
A device for optical measurement of materials includes a zone opposite a dot including a material, a light source emitting light along an axis in the direction of the zone, where the material interacts with the light it receives, and a light guide to convey a proportion of the light emitted by the dot under the effect of the illumination. The guide includes a light scatterer associated with the source and causing a proportion of the light emitted by the dot to penetrate into the guide, such that it is guided in a direction perpendicular to the axis; the scatterer is annular in shape, and thus delimits a zone of the light guide, and the area of the zone is greater than or equal to the area of the cross-section of the portion of light beam incident to the material.