Scattering-Assisted Super-Localization Microscopy Method

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Solution Overview

Problem

Conventional fluorescence microscopy techniques face limitations in achieving high optical resolution, especially when dealing with opaque or scattering samples, as they require a lens close to the sample and are hindered by numerical aperture constraints and optical aberrations, which restricts non-invasive and in-vivo measurements.

Innovation Solution

The method involves wavefront phase and amplitude modulation of a coherent light beam to enhance constructive interference and control scattered light, maximizing fluorescent signal intensity and overcoming the diffraction limit by shaping the light focus within the sample, independent of the microscope's optics, using a Digital Micromirror Device for optimization.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional fluorescence microscopy is used with a lens close to the sample, then optical resolution is improved, but the working distance is reduced and non-invasive measurements are limited

Engineering Contradiction:
Improveoptical resolutionVSAvoidworking distance
Core Design Contradiction:
Measurement precisionVSLength of moving object

Solution Approach 1:

The patent transitions from direct spatial resolution enhancement through proximity to resolution enhancement through wavefront modulation in the Fourier domain. By modulating the wavefront phase and amplitude before light enters the scattering sample, the system achieves sub-diffraction resolution without requiring physical proximity to the sample, effectively solving the contradiction between resolution and working distance.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the parameters of the excitation light (phase and amplitude) to achieve enhanced resolution. By optimizing these wavefront parameters through iterative algorithms, the system achieves super-resolution imaging while maintaining a long working distance, resolving the contradiction between measurement precision and accessibility.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If high numerical aperture optics are used to improve resolution, then optical resolution is improved, but the complexity of the optical system increases

Engineering Contradiction:
Improveoptical resolutionVSAvoidoptical system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces complex high numerical aperture optical systems with a simpler optical setup combined with wavefront modulation. Instead of using sophisticated lens systems with high NA, the invention uses phase and amplitude modulation of the excitation beam to achieve super-resolution, substituting mechanical/optical complexity with computational control of light properties.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent segments the wavefront modulation control into independent phase and amplitude components that can be optimized separately. This segmentation allows for simplified optical hardware while achieving complex resolution enhancement through controlled modulation of different wavefront parameters.

Inventive Principle:
Principle #1Segmentation

3Illumination intensity

If high-power light sources are used to maximize fluorescent signal, then signal intensity is improved, but sample damage increases

Engineering Contradiction:
Improvefluorescent signal intensityVSAvoidsample damage
Core Design Contradiction:
Illumination intensityVSObject-affected harmful factors

Solution Approach 1:

The patent changes the parameters of the excitation light from high power to optimized phase and amplitude modulation. By controlling the wavefront parameters rather than simply increasing power, the system achieves enhanced fluorescent signal intensity while maintaining lower overall light exposure, thereby reducing photodamage to the sample.

Inventive Principle:
Principle #35Parameter changes

4Measurement precision

If scattering correction is applied to improve resolution in opaque samples, then measurement precision is improved, but the complexity of the system increases

Engineering Contradiction:
Improveresolution in scattering samplesVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies preliminary wavefront phase and amplitude modulation before light enters the scattering sample. By pre-shaping the wavefront to account for expected scattering effects, the system achieves resolution enhancement in opaque samples without requiring complex real-time scattering correction mechanisms during image acquisition.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent employs iterative optimization algorithms that use feedback from detected fluorescent signals to refine wavefront modulation parameters. This feedback mechanism enables the system to adapt to scattering conditions and achieve high resolution in opaque samples while maintaining relatively simple optical hardware.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach achieves sub-diffraction resolution, up to six times higher than theoretical limits, allowing for high-resolution imaging with a long working distance and low damage to samples, without the need for high-power light sources, making it suitable for in-vivo investigations.

Implementation Method 1

wavefront phase and/or amplitude modulation of an exciting coherent light beam on a scattering sample for building constructive interference out of light beams scattered by the sample

Methodology Applied
Scientific EffectConstructive interference: Interference

Implementation Method 2

light scattered by the sample itself to increase the effective numerical aperture

Methodology Applied
Scientific EffectLight scattering: Scattering

Implementation Method 3

maximizes the intensity of a fluorescent signal emitted by fluorescent proteins of a biological tissue

Methodology Applied
Scientific EffectFluorescence: Fluorescence

Data Source

PatentUS11867893B2Scattering-assisted super-localization microscopy method and relative apparatus
Publication Date: 2024.01.09 DISRUPTIVE TECHNOLOGICAL ADVANCES IN LIFE SCIENCE S R L SOCIETÀ BENEFIT
  • US11867893B2 patent drawing
  • US11867893B2 patent drawing
  • US11867893B2 patent drawing

AI summary

Fluorescence microscopy method comprising: illuminating a scattering sample with a coherent excitation light beam having a wavefront with an initial configuration for exciting fluorescent emitters in the scattering sample; acquiring an initial image; selecting target pixels in an area of the initial image; optimising the initial configuration of the wavefront for each target pixel for decreasing the speckle grain size and obtaining a final image; subtracting the initial image from the final image for each target pixel, obtaining an image; fitting the image with a Gaussian function with free center coordinates for each target pixel; generating an image containing a Gaussian distribution centered at the coordinates and intensity, and with a waist equal to an average size S of speckle grain of the scattering sample, for each target pixel; and generating a final image of the sample by summing the images of the target pixels.