Scintillator Array Reflective Layer Structure for Dimensional Accuracy

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Solution Overview

Problem

Existing technologies have not adequately addressed the issue of maintaining the accuracy of dimension in scintillator arrays used in X-ray detectors, which affects the alignment with photodiodes and consequently the resolution and image accuracy of X-ray CT devices.

Innovation Solution

A scintillator array is designed with integrated scintillator segments and reflective layers, where the first reflective layer is integrated with a second reflective layer is provided on the X-ray incident surface of the scintillator array, the second reflective layer is integrated with a second reflective layer on the X-ray incident surface, and the reflective layers are made of specific materials and dimensions to minimize deformation and maintain accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If scintillator segments are downsized to increase the number of channels, then the resolution of X-ray CT device is enhanced, but the accuracy of dimension of the scintillator array degrades

Engineering Contradiction:

ImproveresolutionVSAvoidaccuracy of dimension

Core Design Contradiction:

Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent merges the scintillator segments with reflective layers into an integrated structure. The first reflective layer is integrated with the scintillator segments, and the second reflective layer is provided on the X-ray incident surface, creating a unified component that maintains dimensional accuracy while supporting high-resolution detection

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The patent uses composite material structures combining scintillator ceramic materials with reflective layer materials. This composite approach allows the scintillator array to maintain structural integrity and dimensional precision while achieving the required optical performance for high-resolution X-ray detection

Inventive Principle:

Principle #40Composite materials

2Area of stationary object

If the area of the scintillator array is increased to expand detection area, then the coverage is improved, but the accuracy of dimension becomes more difficult to maintain

Engineering Contradiction:

Improvedetection areaVSAvoidaccuracy of dimension

Core Design Contradiction:

Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent divides the scintillator array into multiple scintillator segments arranged in a matrix pattern, with each segment corresponding to a detection element. This segmentation allows the large-area array to be manufactured from smaller, more manageable units that can be precisely controlled, while maintaining overall dimensional accuracy through the integrated reflective layer structure

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

By integrating reflective layers with the scintillator segments, the patent creates a unified structure that maintains dimensional accuracy across large areas. The reflective layers serve as both optical components and structural elements that constrain dimensional variations throughout the entire array

Inventive Principle:

Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively suppresses dimensional degradation and variations, enhancing the resolution and image accuracy of X-ray detectors and inspection devices, thereby improving diagnostic and non-destructive inspection capabilities.

Implementation Method 1

X-rays incident upon the scintillator segments are converted into visible light

Methodology Applied

Scientific EffectScintillation: Scintillation

Implementation Method 2

a reflective layer is formed between the scintillator segments and integrated therewith to produce a scintillator array

Methodology Applied

Scientific EffectReflection: Reflection

Data Source

PatentUS20260003083A1Scintillator array, x-ray detector, and x-ray inspection device

Publication Date: 2026.01.01 NITERRA MATERIALS CO LTD

AI summary

A decrease and variations in dimensional accuracy due to deformation is suppressed.The scintillator array according to an embodiment includes a plurality of scintillator segments each including a sintered body of a rare earth oxysulfide phosphor, a first reflective layer interposed between adjacent scintillator segments so as to integrate the scintillator segments, and a second reflective layer located on a surface side of the scintillator segments on which X-rays are incident. The amount of deformation of the corners of the second reflective layer is 20 μm or smaller.