Scintillator Crystal Layout for Uniform Radiation Image Resolution
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Solution Overview
Problem
Existing radiation detection apparatuses face issues with non-uniform resolution distribution within captured radiation images due to thickness variations in columnar crystals formed during vacuum deposition, leading to uneven image quality.
Innovation Solution
A radiation detection apparatus with a scintillator layer where columnar crystals have concentric angle and thickness distributions that counteract thickness variations, ensuring uniform resolution across the image plane by adjusting tilt angles and thicknesses to balance light scattering and absorption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If columnar crystals are formed by vacuum deposition to convert radiation into light, then radiation detection function is achieved, but thickness distribution within the plane causes non-uniform resolution
Solution Approach 1:
The patent applies local quality by creating different thickness distributions in different regions of the scintillator layer. Specifically, the central region has a first thickness distribution while the peripheral region has a second thickness distribution, allowing each region to be optimized for its specific detection requirements and compensating for the inherent non-uniformity of vacuum deposition
Solution Approach 2:
The patent changes the thickness parameter of the columnar crystals in different regions. By adjusting the thickness distribution from the central region to the peripheral region, the patent compensates for the non-uniform resolution caused by vacuum deposition, achieving uniform resolution across the entire detection plane
2Area of stationary object
If columnar crystals have thickness distribution to cover the sensor panel, then detection area is increased, but resolution uniformity within the plane deteriorates
Solution Approach 1:
The patent divides the scintillator layer into central and peripheral regions with different thickness distributions. The central region uses a first thickness distribution while the peripheral region uses a second thickness distribution, allowing each region to contribute to detection area while maintaining overall resolution uniformity
Solution Approach 2:
The patent segments the scintillator layer into distinct regions (central and peripheral) with different characteristics. This segmentation allows independent optimization of each region's thickness distribution to achieve both large detection area and uniform resolution
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution achieves an excellent in-plane distribution of resolutions, minimizing differences in modulation transfer functions across the detection area, resulting in improved image uniformity and quality.
Implementation Method 1
a scintillator layer on which a plurality of columnar crystals configured to convert radiation into light are arranged
Implementation Method 2
a rectangular sensor panel having a pixel array including a plurality of photoelectric conversion elements
Data Source
AI summary
A radiation detection apparatus comprises a rectangular sensor panel having a pixel array including a plurality of photoelectric conversion elements, and a scintillator layer on which a plurality of columnar crystals configured to convert radiation into light are arranged. The scintillator layer has one side along an outer shape of the sensor panel and an opposite side of the one side and a region between the one side and the opposite side in which directions in which columnar crystals extend and a normal line of a main surface of the sensor panel form angles. The angles have a concentric angle distribution decreasing in angle from a central portion of the one side toward the opposite side, and thicknesses of the plurality of columnar crystals have a concentric thickness distribution increasing in thickness from the central portion of the one side to the opposite side.


