Scintillator Side-Surface Imaging for Clearer X-Ray Inspection
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Solution Overview
Problem
Existing X-ray inspection devices face issues with obtaining clear and suitable X-ray images due to low luminance and scattering within scintillators, and large penumbra in reflection imaging types, leading to unclear images.
Innovation Solution
The X-ray inspection device is configured with a scintillator disposed such that the boundary between the incident surface and a side surface is within the X-ray emission range, with an imaging device facing the side surface to image visible light, and includes an X-ray shielding member to shield specific regions, optimizing the positional relationship to minimize penumbra and enhance image clarity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If transmission imaging type is used, then X-ray image can be generated, but visible light is absorbed inside scintillator resulting in low luminance and dark image
Solution Approach 1:
The patent inverts the conventional transmission imaging approach by imaging the visible light emitted from the incident surface of the scintillator rather than from the opposite surface. This inversion allows the imaging device to capture visible light before it is absorbed inside the scintillator, thereby solving the low luminance problem while maintaining the transmission imaging configuration.
2Illumination intensity
If particle type scintillator is used, then scintillator can convert X-rays to visible light, but visible light scatters inside scintillator resulting in unclear image
Solution Approach 1:
The patent extracts the visible light emission from the interior of the scintillator by positioning the imaging device to capture light from the incident surface. This extraction approach prevents the scattered visible light from degrading image quality, as the imaging occurs at the surface where light is emitted before scattering occurs within the particle type scintillator.
3Measurement precision
If reflection imaging type is used, then visible light can be imaged from incident surface, but scintillator must be tilted increasing distance and causing large penumbra
Solution Approach 1:
The patent inverts the reflection imaging configuration by maintaining the scintillator in a non-tilted position and instead inverting the imaging target from the opposite surface to the incident surface. This allows the scintillator to remain close to the inspected object without tilting, minimizing the distance and reducing penumbra while still achieving clear imaging of visible light from the incident surface.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for the generation of bright and clear X-ray images with reduced penumbra, enabling accurate detection and estimation of defect features in inspected objects.
Implementation Method 1
a scintillator configured to convert the X-rays incident through the inspected object into visible light
Implementation Method 2
converts the X-rays passing through the inspected object into visible light by a scintillator (emits fluorescence by the X-rays and emits visible light)
Data Source
AI summary
An X-ray inspection device includes: an X-ray emission device configured to emit X-rays toward an inspected object; a scintillator configured to convert the X-rays incident through the inspected object into visible light; and an imaging device configured to image the visible light from the scintillator to generate an X-ray image. The scintillator is disposed such that a boundary between an incident surface on which the X-rays are incident and a first side surface intersecting the incident surface is located within an emission range of the X-rays, and the imaging device is arranged so as to face the first side surface, and is configured to image the visible light emitted from a first region of an entire region of the first side surface.