High-Speed Single-Point Scratch Test Device for Nanometer Depth Control
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Solution Overview
Problem
Current single-point scratch test methods for ultra-precision grinding are limited by linear scratch motion, sampling frequency, and tool feed speed, making it difficult to achieve high-speed scratch testing with accurate force signal collection and controlled scratch depth, especially for nanometer cutting depths.
Innovation Solution
A nanometer cutting depth high-speed single-point scratch test device with a micro convex structure on the test piece, utilizing an air-bearing turntable and nano positioning stage to control scratch depth and speed, and a force sensor to collect accurate force signals, allowing for high-speed scratch testing with micron/submicron curvature radius tools.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If high-speed scratch testing is implemented using pendulum method, then scratch speed is improved to m/s magnitude, but sampling frequency limitation prevents accurate force signal collection at nanometer cutting depths
Solution Approach 1:
The patent transitions from static AFM scanning to dynamic high-speed scratch testing by rotating the workpiece at controlled speeds while maintaining nanometer-depth cutting. The system dynamically adjusts rotation speed and feed rate to achieve m/s scratch speeds while synchronizing data acquisition to capture force signals at appropriate sampling rates for each speed condition.
Solution Approach 2:
The patent systematically varies key parameters including scratch depth (10-100 nm), rotation speed (50-5000 rpm), and feed rate to create a comprehensive test matrix. By changing these parameters across multiple test groups, the system evaluates machining mechanisms under different conditions while maintaining accurate measurement capability through synchronized data acquisition.
2Measurement precision
If AFM-based nanometer scratch testing is used, then measurement precision is improved, but scratch speed deteriorates to μm/s magnitude which does not reflect actual grinding conditions
Solution Approach 1:
The patent replaces the traditional AFM scanning mechanism with a high-speed rotation and feed system. Instead of moving the probe slowly across a stationary workpiece, the system rotates the workpiece at high speed while advancing the probe, substituting precise positional control with synchronized rotational and linear motion control, thereby achieving both high speed and measurement accuracy.
3Speed
If ball-on-disc scratch method is used for high-speed testing, then scratch speed is improved, but scratch depth control deteriorates and cannot achieve nanometer magnitude precision
Solution Approach 1:
The patent controls scratch depth by moving the probe in the vertical Z-dimension independently from the horizontal scratching motion. This separation of depth control (vertical) from scratching motion (horizontal rotation and feed) allows precise nanometer-depth control through Z-axis positioning while maintaining high-speed scratching through rotation, eliminating the depth control limitations of ball-on-disc methods.
4Productivity
If high-speed scratch testing is implemented, then productivity is improved, but device complexity increases due to synchronization requirements
Solution Approach 1:
The patent implements synchronized data acquisition that collects scratch force, normal force, and tangential force signals simultaneously with rotation speed and feed rate information. This feedback-based synchronization ensures that force signals are accurately correlated with corresponding scratch depths and positions, enabling high-speed testing while maintaining data integrity through coordinated measurement of all relevant parameters.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device enables true ultra-precision grinding state restoration, accurate force-scratch depth correlation, and controlled scratch length, facilitating the identification of transformation points and reducing tool abrasion.
Implementation Method 1
an air-bearing turntable 3 fixedly installed on the workbench 2
Data Source
AI summary
A nanometer cutting depth high-speed single-point scratch test device includes a workbench, an air-bearing turntable, a test piece fixture, a test piece, a Z-direction feeding device, a nano positioning stage, a force sensor and a scratch tool. A micro convex structure with controllable length and height is machined in a position of the test piece to be scratched.