Partitioned Seal Material Test Bench for Rapid Temperature Cycling
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Solution Overview
Problem
Existing temperature cycle test devices struggle to alternately and rapidly change temperatures in a wide temperature range, affecting the accuracy and stability of test data.
Innovation Solution
A partitioned contact temperature cycle test bench with a temperature control device comprising first and second thermostatic modules, a support device, and a drive device that allows the thermal conduction portion to alternately contact these modules, enabling rapid temperature changes by rotating the support device to switch between high and low temperatures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If a thermoelectric device is used to heat or cool the thermal conduction medium sequentially from low temperature to high temperature and back, then the temperature cycle can be achieved in a wide temperature range, but the temperature cannot change rapidly and alternately, affecting test data accuracy and stability
Solution Approach 1:
The temperature control system is segmented into multiple independent thermostatic modules (first thermostatic module and second thermostatic module), each maintaining a different constant temperature. The thermal conduction portion can selectively contact different modules by rotating to different positions, enabling rapid temperature switching without sequential heating/cooling processes.
Solution Approach 2:
Multiple thermostatic modules are prepared in advance, each pre-maintained at different constant temperatures. When temperature cycling is needed, the thermal conduction portion simply rotates to contact the appropriate pre-prepared module, eliminating the time required to heat or cool the medium sequentially.
2Temperature
If a thermoelectric device heats and cools the thermal conduction medium sequentially, then temperature cycling in a wide range is possible, but the process takes certain time and cannot alternate rapidly
Solution Approach 1:
The temperature control system is divided into multiple independent thermostatic modules operating simultaneously at different temperatures. The thermal conduction portion rotates to contact different modules, achieving rapid temperature cycling without the time-consuming sequential heating and cooling process.
Solution Approach 2:
The support device rotates the thermal conduction portion periodically between different thermostatic modules, creating a periodic temperature cycling effect. This rotational periodic action enables rapid alternation between temperature states, dramatically reducing the time required for temperature cycling compared to sequential thermal processing.
3Measurement precision
If traditional temperature cycle test devices are used, then temperature simulation is possible, but the accuracy and stability of test data are affected due to slow temperature alternation
Solution Approach 1:
The test device uses multiple independent thermostatic modules, each maintaining precise constant temperatures. The thermal conduction portion selectively contacts different modules through rotation, enabling rapid temperature switching that improves both measurement precision and testing efficiency simultaneously.
Solution Approach 2:
The traditional thermal conduction-based temperature cycling is replaced with a mechanical rotation system. The support device rotates the thermal conduction portion to different positions, where it contacts different thermostatic modules. This mechanical substitution enables precise, rapid, and repeatable temperature cycling, significantly improving test data accuracy and productivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system enables rapid and accurate simulation of temperature cycles by maintaining constant temperatures in each thermostatic module, allowing the thermal conduction portion to alternate between them, thus enhancing the accuracy and efficiency of seal material performance testing.
Implementation Method 1
a first thermostatic module and a second thermostatic module, where the first thermostatic module is provided with a first thermal conduction surface, the second thermostatic module is provided with a second thermal conduction surface
Implementation Method 2
the support device is provided with a thermal conduction portion, the thermal conduction portion is in contact with the piece to be tested, and the thermal conduction portion is in contact with any one of the first thermal conduction surface and the second thermal conduction surface
Data Source
AI summary
The present application relates to the field of test device, and provides a partitioned contact temperature cycle test bench for seal material performance, including a temperature control device, a support device and a drive device, where the temperature control device includes a first thermostatic module and a second thermostatic module, the first thermostatic module is provided with a first thermal conduction surface, the second thermostatic module is provided with a second thermal conduction surface, the first thermal conduction surface and the second thermal conduction surface enclose a receive cavity, and temperature of the first thermostatic module is different from temperature of the second thermostatic module; the support device supports a piece to be tested, the support device is rotatably provided in the receive cavity, the support device is provided with a thermal conduction portion, the thermal conduction portion is in contact with the piece to be tested, and the thermal conduction portion is in contact with any one of the first thermal conduction surface and the second thermal conduction surface; and the drive device drives the support device to rotate relative to the temperature control device. Such an arrangement solves the problem in the related art that the temperature cycle test device cannot alternately change rapidly in a wide temperature range.