Sealed Contact Unit Holder Assembly for Low-Temperature Pin Reliability
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Solution Overview
Problem
Semiconductor testing equipment faces issues with contact resistance and leakage failures due to temperature variations, leading to degraded yield performance and difficulty in replacing bent or twisted receptacle pins during low-temperature tests.
Innovation Solution
A contact unit holder (CUH) receptacle assembly with individually separated receptacle pins in through-holes, sealed with silicone rubber, prevents contact and guides movement, maintaining temperature segregation to prevent condensation and moisture buildup.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If receptacle pins are placed in physical contact with metallized contact surfaces for electrical connection, then electrical connectivity is achieved, but contact resistance and leakage failures occur under temperature variations
Solution Approach 1:
The receptacle pins are individually separated and housed in separate through-holes within the receptacle housing, preventing contact between adjacent pins. This segmentation isolates each electrical connection path, eliminating leakage failures between pins while maintaining reliable electrical connectivity to the semiconductor device under test.
2Ease of operation
If receptacle pins are exposed in the receptacle base for easy access, then ease of operation is improved, but pins are susceptible to bending and twisting during low-temperature tests
Solution Approach 1:
The receptacle pins are nested within the receptacle housing, with each pin positioned inside a dedicated through-hole that extends from the receptacle base to the receptacle cover. This nested structure provides mechanical support and constraint, preventing bending and twisting of the pins while maintaining their electrical connection function.
3Ease of manufacture
If the receptacle housing is open to allow pin insertion, then ease of manufacture is improved, but temperature segregation fails leading to condensation and moisture buildup
Solution Approach 1:
The receptacle cover acts as a flexible sealing element that closes the receptacle housing, creating a sealed environment around the receptacle pins. This flexible shell structure prevents moisture and condensation from reaching the pins while maintaining temperature segregation between the cold handler chamber and ambient environment, thereby preventing leakage failures.
4Device complexity
If multiple receptacle pins are placed close together for compact design, then device complexity is reduced, but pins may contact each other causing shorted connections
Solution Approach 1:
The receptacle housing is segmented into multiple through-holes, each housing a separate receptacle pin. This segmentation physically isolates each pin within its own dedicated pathway, preventing contact between adjacent pins even when they are positioned close together for compact design. The segmentation maintains connection isolation while achieving space efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution mitigates contact resistance and leakage failures, ensuring reliable electrical connections and easy replacement of receptacle pins under extreme temperature conditions.
Implementation Method 1
the through-holes for the receptacle pins may be sealed with individual sealing member (such as Silicon rubber) to provide separation between the cold air of a handler chamber and the ambient air
Data Source
AI summary
A contact unit holder (CUH) receptacle assembly and a method of manufacturing the CUH receptacle assembly are disclosed, where the receptacle assembly includes a receptacle cover removably attached to a receptacle base. The device may include a receptacle housing extending from an inner surface of the receptacle base to an inner surface of the receptacle cover, a through-hole defined by the receptacle housing, the through-hole extending from an outer surface of the receptacle base to the inner surface of the receptacle cover, and a receptacle pin disposed in the through-hole and protruding from the outer surface of the receptacle base, the receptacle pin being configured to contact a semiconductor device under test (DUT).


