Secondary Radiation Source for Opaque Load Inspection
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Solution Overview
Problem
Inspection systems using radiation struggle to detect hidden objects within loads made of opaque materials, as these objects appear dark or difficult to discern in transmission views.
Innovation Solution
A system employing a secondary source of radiation that emits electromagnetic radiation through Compton scattering and pair production, utilizing scattering elements with varying thickness and material to control focal spot size, intensity, and spectrum, and a collimator to create a secondary inspection beam for effective detection of hidden objects within loads.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If transmission radiation inspection is used, then inspection capability is provided, but detection of hidden objects in opaque materials becomes difficult
Solution Approach 1:
The patent divides the inspection system into multiple independent radiation sources positioned at different locations around the load. Each source provides a separate inspection view, allowing objects hidden in transmission views to be detected from alternative angles where they are not obscured by opaque materials.
Solution Approach 2:
The patent transitions from a single transmission view (one-dimensional inspection path) to multiple inspection views from different spatial positions (multi-dimensional inspection). This dimensional expansion allows detection of objects that are invisible or difficult to detect in any single transmission view.
2Difficulty of detecting and measuring
If multiple radiation generators are used for multiple views, then detection capability improves, but system cost increases
Solution Approach 1:
The patent makes a single radiation generator serve multiple functions by positioning it to irradiate multiple different sources at different locations. This single generator provides inspection capability for multiple views, eliminating the need for multiple expensive generators while maintaining enhanced detection capability.
Solution Approach 2:
The patent uses the radiation from a single generator to activate multiple secondary sources that then perform the actual inspection functions. The system essentially serves itself by using the generated radiation to create multiple inspection beams through different material sources, reducing the need for additional expensive equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the detection of hidden objects within loads by varying the energy distribution and projection area of the secondary radiation, improving the visibility of opaque materials and reducing costs by using a single generator for multiple views.
Implementation Method 1
A system employing a secondary source of radiation that emits electromagnetic radiation through Compton scattering and pair production
Implementation Method 2
A system employing a secondary source of radiation that emits electromagnetic radiation through Compton scattering and pair production
Data Source
AI summary
In examples, it is disclosed an inspection system comprising: a secondary source of radiation configured to generate secondary electromagnetic radiation for inspection of a load in response to being irradiated by primary electromagnetic radiation from a primary generator of electromagnetic radiation; and one or more detectors configured to detect radiation from the load after interaction with the secondary inspection beam.