Secure Semiconductor IP Server for Failure Analysis
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Solution Overview
Problem
In semiconductor manufacturing, failure analysis is hindered by the difficulty in accessing and integrating information from various proprietary databases, leading to delays and exposure of sensitive intellectual property when trying to identify the source of manufacturing or design issues across complex supply chains.
Innovation Solution
A secure semiconductor IP access server process that extracts relevant data from an Electronic Product Definition Design and Test Database, traces interconnects and components contributing to failures, and stores localized defect information while protecting trade secrets by defining boundaries and using alias names, enabling graphical representation of failure origins and components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If failure analysis requires access to entire electronic product design databases, then analysis completeness is improved, but intellectual property exposure and data transfer complexity increase
Solution Approach 1:
The patent extracts only the necessary failure analysis information from the entire electronic product design database by tracing signal paths from test points to identify defective components and interconnects. This selective extraction provides complete failure analysis for the affected area while leaving the rest of the proprietary design data intact and inaccessible, thus resolving the contradiction between analysis completeness and IP protection.
Solution Approach 2:
The system segments the large electronic product design database into manageable portions by creating a traceable map that isolates only the relevant sections containing failure information. This segmentation allows failure analysis to be performed on specific segments (defective components and their interconnects) without requiring access to the entire database, thereby maintaining IP security while enabling complete failure analysis of the affected area.
2Reliability
If proprietary database formats are used to protect intellectual property, then security is improved, but data integration and access difficulty increase
Solution Approach 1:
The patent introduces a proprietary database format as an intermediary layer between the secure stored data and the failure analysis tools. This intermediary format maintains the security and proprietary nature of the stored design data while providing standardized access points and traceability mechanisms that enable failure analysis tools to query and integrate information without needing to parse the entire proprietary database, thus resolving the contradiction between security and ease of access.
3Measurement precision
If complete design data is transferred to support failure analysis, then analysis accuracy is improved, but transfer time and system complexity increase
Solution Approach 1:
The system performs preliminary actions by pre-establishing traceability maps and index structures during the design phase that link test points to components and interconnects. This preliminary preparation enables rapid failure analysis by allowing the system to quickly trace signal paths and identify defective areas without needing to transfer and process the entire design database, thus achieving high accuracy while minimizing transfer time.
Solution Approach 2:
The patent extracts only the essential traceability information and failure-related data from the complete design database, transferring only this extracted information to support failure analysis. This selective extraction maintains the accuracy needed for precise failure location by preserving all necessary traceability links and component information while dramatically reducing the volume of data that needs to be transferred and processed.
4Measurement precision
If detailed component and interconnect information is accessed, then failure analysis precision is improved, but data processing complexity and security risks increase
Solution Approach 1:
The patent segments the detailed component and interconnect information into organized traceability structures that map test points to specific components and their connections. This segmentation allows the system to access and process only the detailed information relevant to the failure area rather than processing the entire design database, thereby achieving high failure analysis precision while reducing overall data processing complexity through structured organization and selective access.
Data Source
AI summary
A method for operating a secure semiconductor IP access server to support failure analysis. A client presents a test failure and failure type to an automated server which traverses an electronic product design, definition, and test database to report specifically those components and interconnect likely to cause the failure with geometrical information which may be displayed on the client. Other aspects of semiconductor IP are protected by the server by limiting the trace mechanism and renaming components.