Single Event Effects Immune Linear Voltage Regulator Design
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Solution Overview
Problem
Linear voltage regulators are susceptible to single event effects (SEE) from radiation, which can cause transient output voltages that may lead to permanent damage or instability, and existing solutions like adding series resistors compromise voltage regulation and step load response time.
Innovation Solution
A SEE immune linear voltage regulator design that includes an input node, output node, first and second transistor control logics, and transistors, allowing selective operation in linear regulation and saturation modes to maintain voltage control and stability, with transistors automatically switching modes to manage SEE-induced transients.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a series resistor is added at the voltage regulator input or output to alleviate SEE events, then SEE susceptibility is reduced, but voltage regulator step load response time increases and/or instability occurs
Solution Approach 1:
The patent divides the single pass transistor into two separate transistors (first pass transistor and second pass transistor) that operate in complementary saturation and linear modes. This segmentation allows one transistor to quickly respond to SEE events in saturation mode while the other maintains regulation in linear mode, achieving both fast response and immunity without requiring external series resistors.
Solution Approach 2:
The patent implements dynamic mode switching between saturation and linear operation for the two pass transistors based on detected voltage conditions. The control logic dynamically transitions transistors between modes to optimize response to SEE events while maintaining regulation, eliminating the need for fixed series resistance that degrades step load response.
2Reliability
If a series resistor is added at the voltage regulator input or output to alleviate SEE events, then SEE susceptibility is reduced, but stability deteriorates
Solution Approach 1:
By segmenting the pass transistor function into two complementary transistors with independent control, the system achieves SEE immunity through redundant protection paths without introducing the stability-degrading effects of external series resistors. Each transistor can be independently optimized for its operational mode.
Solution Approach 2:
The patent employs control logic that continuously monitors voltage conditions and provides feedback to dynamically adjust the operational modes of the two pass transistors. This feedback mechanism maintains stability by ensuring proper mode transitions while providing active protection against SEE-induced transients, replacing the passive stability compromise of series resistors with active control.
Data Source
AI summary
A single event effects (SEE) immune linear voltage regulator includes an input node, an output node, a first transistor control logic, a second transistor control logic, a first transistor, and a second transistor. The regulator is configured such that when the first transistor is operating in linear regulation mode, the second transistor automatically operates in saturation mode, and the voltage at the output node is controlled by the first transistor and the first transistor control logic to be substantially equal to the first reference voltage. Conversely, when the second transistor is operating in linear regulation mode, the first transistor automatically operates in saturation mode, and the voltage at the output node is controlled by the second transistor and the second transistor control logic to be substantially equal to the second reference voltage.