Segmented Carrier Wafer Processing for Dual-Side Semiconductor Access

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Solution Overview

Problem

The existing methods for manufacturing semiconductor devices face challenges in balancing cost reduction and mechanical stability during processing, particularly when dealing with standard wafer sizes and thicknesses, which limits flexibility in meeting conflicting requirements for chip reliability.

Innovation Solution

A method involving processing a semiconductor body at opposite surfaces, attaching it to a carrier with an inner and outer part, and detaching the inner part of the carrier to enhance flexibility and accessibility during manufacturing and testing, allowing for reduced process complexity and improved mechanical stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If wafers are processed at the front side and back side to meet chip reliability requirements, then mechanical stability is improved, but process complexity increases

Engineering Contradiction:
Improvechip reliabilityVSAvoidprocess complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The carrier is segmented into an inner part and an outer part that can be detached separately. The inner part is removed after front side processing to enable back side processing, while the outer part remains attached to provide mechanical support throughout the entire process, resolving the contradiction between reliability and process complexity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The semiconductor wafer is attached to the carrier before front side processing begins. This preliminary attachment provides mechanical stability during processing while allowing subsequent detachment of the inner part, enabling the wafer to be processed at both surfaces without compromising reliability or excessive complexity

Inventive Principle:
Principle #10Preliminary action

2Ease of manufacture

If standard wafer sizes and thicknesses are used, then manufacturing cost is reduced, but manufacturing flexibility is limited

Engineering Contradiction:
Improvemanufacturing costVSAvoidmanufacturing flexibility
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The carrier structure serves multiple functions: it provides mechanical support during processing, enables access to both front and back surfaces, and allows selective removal of the inner part. This multi-functionality enables processing of standard wafers with enhanced flexibility without significantly increasing manufacturing cost

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Stability of the object's composition

If the carrier is attached to the semiconductor body for mechanical stability, then processing stability is improved, but accessibility to the first surface is reduced

Engineering Contradiction:
Improveprocessing stabilityVSAvoidaccessibility to first surface
Core Design Contradiction:
Stability of the object's compositionVSEase of operation

Solution Approach 1:

The carrier is divided into inner and outer parts with different functions. The inner part is detached after front side processing to restore accessibility to the first surface, while the outer part remains to maintain mechanical stability during back side processing, thus resolving the contradiction between stability and accessibility

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20240006218A1Method of manufacturing a semiconductor device
Publication Date: 2024.01.04 INFINEON TECHNOLOGIES AG
  • US20240006218A1 patent drawing
  • US20240006218A1 patent drawing
  • US20240006218A1 patent drawing

AI summary

A method of manufacturing a semiconductor device in a semiconductor body is proposed. The method includes processing a semiconductor body at a first surface of the semiconductor body. The method further includes attaching the semiconductor body to a carrier via the first surface. The carrier includes an inner part and an outer part at least partly surrounding the inner part. The method further includes processing the semiconductor body at a second surface opposite to the first surface. The method further includes detaching the inner part of the carrier from the semiconductor body.