Segmented Conductive Blocks for DRAM Storage-Element Coupling

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Solution Overview

Problem

Conventional DRAM fabrication faces challenges in achieving tighter packing of memory configurations due to difficulties in coupling storage-elements, such as capacitors, with storage-element-contact-regions, especially as integration levels increase.

Innovation Solution

The method involves forming conductive blocks over sets of contact regions, removing central regions and replacing them with insulative material, and coupling storage-elements to the end regions of these blocks, with interconnects extending through the insulative material to digit-line-contact-regions, allowing for improved coupling and scaling of DRAM architectures to higher integration levels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional fabrication processes are used, then existing memory configurations can be manufactured, but tighter packing of memory configurations becomes difficult to achieve

Engineering Contradiction:
Improvetighter packing of memory configurationsVSAvoidfabrication process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The conductive block is segmented into multiple conductive portions by removing central regions and replacing them with insulative material. This segmentation allows independent coupling of storage-elements to different conductive portions, enabling tighter packing of memory configurations while simplifying the fabrication process through modular construction

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from planar memory configurations to three-dimensional stacked architectures by forming conductive blocks that extend vertically and coupling storage-elements to multiple levels. This dimensional change enables tighter packing by utilizing vertical space, achieving higher integration without increasing lateral footprint

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If integration levels are increased, then memory capacity is improved, but coupling storage-elements with storage-element-contact-regions becomes more difficult

Engineering Contradiction:
Improvememory integration levelVSAvoidcoupling of storage-elements
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

Conductive blocks are formed and configured with multiple conductive portions before storage-elements are coupled to them. This preliminary action creates pre-configured connection points that simplify the subsequent coupling process, making it easier to integrate storage-elements at higher integration levels without increasing manufacturing difficulty

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The conductive blocks serve as intermediary structures between the storage-elements and the digit-line-contact-regions. By introducing these conductive blocks with multiple conductive portions, the patent creates intermediate connection points that facilitate the coupling of multiple storage-elements to the memory architecture, simplifying the manufacturing process at higher integration levels

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20200286899A1Methods of forming integrated assemblies
Publication Date: 2020.09.10 MICRON TECHNOLOGY INC
  • US20200286899A1 patent drawing
  • US20200286899A1 patent drawing
  • US20200286899A1 patent drawing

AI summary

Some embodiments include a method of forming an integrated assembly. Conductive blocks are formed over a construction. Each of the conductive blocks is over a set which includes a pair of storage-element-contact-regions and a digit-line-contact-region. Each of the conductive blocks is entirely laterally surrounded by first insulative material. Central regions of the conductive blocks are removed to split each of the conductive blocks into a first conductive portion over one of the storage-element-contact-regions and a second conductive portion over another of the storage-element-contact-regions. Second insulative material is formed between the first and second conductive portions. Digit-lines are coupled with the digit-line-contact-regions, and storage-elements are coupled with the storage-element-contact-regions.