Segmented ECC Circuit for High-Bit Memory Error Correction

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Solution Overview

Problem

Existing memory systems, particularly those utilizing quantum mechanical effects like MRAM, face challenges in correcting a large number of error bits due to the exponential increase in circuit complexity required for error correction, which affects operation speed and the number of correctable bits.

Innovation Solution

An ECC circuit is implemented with a first and second sub-ECC circuit, an output multiplexer, and a control logic circuit to manage the distribution of error bits, allowing efficient correction of errors by utilizing two sub-ECC circuits to handle different numbers of error bits, thereby reducing circuit complexity and improving operation speed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the number of error bits that the ECC circuit may correct is increased, then the error correction capability is improved, but the circuit configuration complexity increases exponentially

Engineering Contradiction:
Improveerror correction capabilityVSAvoidcircuit configuration complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent divides the ECC circuit into multiple sub-ECC circuits, each responsible for correcting a specific subset of error bits. This segmentation allows the system to handle a larger total number of error bits without requiring a single exponentially complex circuit, thereby resolving the contradiction between error correction capability and circuit complexity.

Inventive Principle:
Principle #1Segmentation

2Reliability

If the circuit configuration for error correction is increased to correct more error bits, then the number of correctable bits is improved, but the operation speed deteriorates

Engineering Contradiction:
Improvenumber of correctable bitsVSAvoidoperation speed
Core Design Contradiction:
ReliabilityVSSpeed

Solution Approach 1:

By segmenting the ECC circuit into parallel sub-ECC circuits that can operate simultaneously on different error bit subsets, the patent achieves both increased error correction capability and maintained operation speed. The parallel architecture eliminates the speed penalty that would otherwise result from a single large-scale ECC circuit.

Inventive Principle:
Principle #1Segmentation

3Device complexity

If a single ECC circuit is used to correct all error bits, then the circuit configuration is simple, but the number of error bits that can be corrected is limited

Engineering Contradiction:
Improvecircuit configuration simplicityVSAvoidnumber of correctable error bits
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent segments the error correction function across multiple sub-ECC circuits, each handling a portion of the total error bits. This approach maintains relative circuit simplicity while enabling the system to correct a larger total number of error bits than a single circuit could handle alone.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements a universal error correction mechanism where multiple sub-ECC circuits can be configured to handle different numbers and types of error bits. This multi-functionality allows the system to adapt to various error conditions while maintaining a relatively simple overall circuit configuration.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20250298693A1Error correction code circuit, memory system including the same, and method of error correction for memory device
Publication Date: 2025.09.25 SAMSUNG ELECTRONICS CO LTD
  • US20250298693A1 patent drawing
  • US20250298693A1 patent drawing
  • US20250298693A1 patent drawing

AI summary

Disclosed is an ECC circuit, which includes a first sub-ECC circuit to correct a first error including first error bits; a second sub-ECC circuit to correct a second error including second error bits; an output multiplexer circuit to output a plurality of bits, wherein a first plurality of bits among the plurality of bits is output to the first sub-ECC circuit, and wherein a second plurality of bits among the plurality of bits is output to the second sub-ECC circuit; and a control logic circuit configured to control the output multiplexer circuit, and wherein the control logic circuit is further configured to: control the output multiplexer circuit to output at least one of the first error bits to the second sub-ECC circuit based on a number of the first error bits exceeding a first number and a number of the second error bits is less than the first number.