Segmented Emitter Array for Low-Power Depth Sensing
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Solution Overview
Problem
Existing depth measurement technologies, such as beam profile analysis and Time of Flight sensing, face challenges in determining the position of objects with low technical effort and resource requirements, particularly in mobile devices where high pulse power is limited due to current constraints.
Innovation Solution
A detector system comprising a projector with independently driven array areas of emitters and a camera with a matrix of optical sensors, which illuminates an object with a pattern and analyzes the beam profiles of reflected light to determine longitudinal coordinates of reflection features, allowing for efficient position determination in mobile devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If high pulse power is used for the projected pattern, then the illumination intensity is improved, but the use of energy by moving object deteriorates due to current constraints in mobile devices
Solution Approach 1:
The emitter array is divided into multiple independently drivable areas that can be activated sequentially or in different patterns, allowing the system to achieve sufficient illumination intensity without requiring all emitters to operate at maximum power simultaneously, thus reducing overall energy consumption in mobile devices
Solution Approach 2:
The emitter areas are driven in a periodic or sequential manner rather than simultaneously, where each area is activated for a specific duration or pattern. This periodic activation maintains adequate illumination intensity while significantly reducing the peak current and average power consumption compared to simultaneous operation of all emitters
2Measurement precision
If multiple emitter arrays are used for depth measurement, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
The emitter array is segmented into multiple independently controllable areas that can be driven in different patterns or sequences. This segmentation allows the system to achieve depth measurement precision comparable to using multiple separate arrays, while maintaining a single array structure that reduces overall device complexity and manufacturing cost
Solution Approach 2:
The emitter areas are dynamically controllable with flexible timing and pattern options. The system can adaptively select which areas to activate and in what sequences based on the specific measurement requirements, achieving high measurement precision without the static complexity of multiple fixed arrays
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable and cost-effective determination of object positions in various applications, including mobile devices, by utilizing low peak current and synchronized control of emitter arrays, effectively overcoming the limitations of current technologies.
Implementation Method 1
each of the emitters is configured for generating at least one light beam
Implementation Method 2
a reflection light beam propagating from the object to the camera
Implementation Method 3
each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam
Data Source
AI summary
Disclosed herein is a detector for determining a position of at least one object. The detector includesat least one projector for illuminating at least one object with at least one illumination pattern including a plurality of illumination features;at least one control unit configured for controlling light emission of the array areas;at least one camera having at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area; andat least one evaluation device configured for determining at least one longitudinal coordinate for reflection features by analysis of their respective beam profiles.