Segmented Mask Substrate for Lithography Cost Reduction

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Solution Overview

Problem

The high cost and time-consuming process of developing and re-designing masks for photo lithography in manufacturing thin-film transistors, liquid crystal displays, and OLED displays hinder the development of new products.

Innovation Solution

A novel mask substrate is introduced, comprising a first substrate and a patterned substrate, where the width of the first substrate is greater than or equal to the width of the patterned substrate. This mask substrate is used in conjunction with a base and a conductive layer to pattern the conductive layer through exposure and development processes, allowing for efficient formation of electronic devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If traditional masks are used for photo lithography, then patterning can be achieved, but the cost and time for developing and re-designing masks are high

Engineering Contradiction:
Improvemask development cost and timeVSAvoidmask structure complexity
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The mask substrate is divided into two distinct parts: a first substrate providing mechanical support and a second substrate containing the pattern. This segmentation allows the patterned second substrate to be reused across multiple first substrates, eliminating the need to re-design masks for each new product while reducing development costs and time.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The second substrate with the pattern is designed to be universally applicable across multiple first substrates. By separating the reusable patterned component from the disposable support substrate, the same patterned second substrate can serve multiple manufacturing purposes, reducing the need for continuous mask re-design and development.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Strength

If the first substrate width is increased to provide adequate support, then structural strength is improved, but the overall mask substrate size increases

Engineering Contradiction:
Improvemask substrate structural strengthVSAvoidmask substrate area
Core Design Contradiction:
StrengthVSArea of stationary object

Solution Approach 1:

The first substrate is designed with a width that is locally sufficient to provide the necessary mechanical support and handling strength, but not excessively large. The patterned second substrate is positioned on this optimally-sized first substrate, ensuring that the mask substrate has adequate strength for manufacturing while minimizing the overall area and associated costs.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The use of the novel mask substrate reduces the complexity and cost associated with mask development, enabling faster and more efficient production of electronic devices while improving light transmittance and structural strength.

Implementation Method 1

performing exposure and development processes on the conductive layer for patterning the conductive layer

Methodology Applied
Scientific EffectPhoto lithography: Photography

Data Source

PatentUS12287577B2Electronic device and method for manufacturing target substrate
Publication Date: 2025.04.29 INNOLUX CORP
  • US12287577B2 patent drawing
  • US12287577B2 patent drawing
  • US12287577B2 patent drawing

AI summary

An electronic device is provided. The electronic device includes a base and a conductive layer that is disposed on the base and patterned by a plurality of processes. The plurality of processes include providing a mask substrate. The mask substrate includes a first substrate and a patterned substrate. In the cross-sectional view, the width of the first substrate is greater than or equal to the width of the patterned substrate. The plurality of processes include arranging the mask substrate and the base correspondingly. The plurality of processes also include performing exposure and development processes on the conductive layer for patterning the conductive layer, and removing the mask substrate.