Segmented Mesa Transistor Structure to Prevent Turn-Off Latch-Up

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Solution Overview

Problem

Transistor devices are prone to parasitic bipolar transistor activation due to self-biasing substrate current, leading to undesirable latch-up conditions during turn-off, which existing technologies fail to effectively prevent while maintaining desirable on-resistance.

Innovation Solution

The transistor structure incorporates alternating source region segments and body region segments of opposite conductivity types within the mesa region, reducing base resistance without affecting the channel area, thereby preventing parasitic bipolar device turn-on and minimizing latch-up conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional transistor structure is used, then the device can operate, but parasitic bipolar transistor activation occurs due to self-biasing substrate current, leading to latch-up conditions during turn-off

Engineering Contradiction:
Improveprevention of latch-up conditionsVSAvoidparasitic bipolar transistor activation
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The transistor structure segments the source and body regions into alternating segments along the channel, creating a segmented pattern that disrupts the continuous path for parasitic bipolar transistor activation. This segmentation prevents the self-biasing substrate current from triggering latch-up conditions while maintaining device operation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies different conductivity types locally within the mesa region by creating alternating source region segments (first conductivity type) and body region segments (second conductivity type). This local differentiation of electrical properties prevents parasitic bipolar transistor activation in specific locations while maintaining overall device functionality.

Inventive Principle:
Principle #3Local quality

2Reliability

If the base resistance is reduced to prevent parasitic bipolar turn-on, then latch-up conditions are minimized, but the on-resistance may be affected

Engineering Contradiction:
Improveprevention of parasitic bipolar turn-onVSAvoidon-resistance
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The alternating segmented structure allows for reduced base resistance through optimized segment geometry and spacing, while the segmented configuration maintains appropriate on-resistance by preserving the channel area. The segmentation enables independent optimization of base resistance and on-resistance parameters.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent optimizes parameters such as segment width, segment spacing, and doping concentrations to achieve the desired balance between base resistance reduction and on-resistance maintenance. By adjusting these parameters, the structure minimizes latch-up conditions while preserving energy efficiency.

Inventive Principle:
Principle #35Parameter changes

3Area of stationary object

If the mesa width is minimized to reduce area, then device area is reduced, but manufacturing precision and performance may be compromised

Engineering Contradiction:
Improvemesa widthVSAvoidmesa width control
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The segmented structure allows for minimized mesa width while maintaining manufacturing precision through the periodic pattern. The alternating source and body region segments create a self-defining pattern that is easier to manufacture with precise control, as the segments provide natural reference points for alignment and dimension control.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS11996477B2Transistor device having a source region segments and body region segments
Publication Date: 2024.05.28 SEMICON COMPONENTS IND LLC
  • US11996477B2 patent drawing
  • US11996477B2 patent drawing
  • US11996477B2 patent drawing

AI summary

In one general aspect, an apparatus can include a first trench disposed in a semiconductor region and including a gate electrode and a second trench disposed in the semiconductor region. The apparatus can include a mesa region disposed between the first trench and the second trench. The apparatus can include a source region segment of a first conductivity type disposed in a first side of the mesa region where the source region segment is included in a plurality of source region segments and where the plurality of source region segments are aligned along the longitudinal axis. The apparatus can include a body region segment of a second conductivity type disposed in a second side of the mesa region opposite the first side of the mesa region and having a portion disposed above the source region segment where the body region segment is included in a plurality of body region segments.