Segmented Probe Head Contact Element for High-Frequency Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing probe heads face challenges in high-frequency applications due to increased stiffness of short contact probes, leading to breakage risks and signal noise, particularly in devices with reduced probe lengths.
Innovation Solution
A contact element with a conductive section less than 1000 μm, separated by an insulating section, providing damping and mechanical support, reduces breakage risk while maintaining electrical conductivity for high-frequency signal transmission.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If the contact probe length is reduced for high-frequency applications, then signal noise is reduced, but the stiffness increases leading to breakage risks
Solution Approach 1:
The contact probe is divided into multiple sections: a first conductive section for signal transmission, a second conductive section, and an intermediate insulating section separating them. This segmentation allows the probe to maintain electrical conductivity for high-frequency signals while the insulating section provides mechanical flexibility and stress relief, reducing breakage risk.
Solution Approach 2:
The contact probe uses composite construction with different material properties in different sections. The conductive sections provide electrical conductivity for signal transmission, while the insulating intermediate section provides mechanical flexibility and damping. This composite approach allows optimization of each section for its specific function, resolving the contradiction between signal integrity and mechanical strength.
2Reliability
If the contact probe length is reduced, then high-frequency signal transmission is improved, but the probe stiffness increases causing potential damage to contact pads
Solution Approach 1:
By segmenting the probe into conductive and insulating sections, the design allows the short conductive portions to maintain signal integrity while the insulating sections provide mechanical compliance. This prevents excessive force from being transmitted to the contact pads, reducing damage risk while maintaining high-frequency signal quality.
Solution Approach 2:
The probe design changes the physical parameters of different sections - the conductive sections have optimized length and cross-section for electrical performance, while the insulating intermediate section has properties optimized for mechanical flexibility and stress distribution. This parameter optimization in different zones resolves the contradiction between signal transmission and contact pad protection.
3Reliability
If the contact probe is made shorter to minimize inductance, then high-frequency performance is improved, but the mechanical durability decreases
Solution Approach 1:
The probe is segmented into multiple conductive and insulating sections along its length. The short conductive sections minimize inductance for high-frequency performance, while the insulating sections between them provide mechanical flexibility and stress relief, increasing overall probe durability and lifespan without compromising electrical performance.
Solution Approach 2:
The composite structure combines conductive materials optimized for electrical performance with insulating materials optimized for mechanical properties. This allows the probe to achieve both high-frequency performance through short conductive paths and extended lifespan through the mechanical benefits of the insulating intermediate sections.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the durability and signal integrity of probe heads by minimizing breakage and noise, ensuring reliable electrical connections in high-frequency devices.
Implementation Method 1
a third section which is interposed between the first section and the second section and is made of an electrically insulating material, said third section being configured to electrically insulate the first section from the second section
Implementation Method 2
a first section which extends along the longitudinal axis starting from the first contact end towards the second contact end and is made of an electrically conductive material
Data Source
AI summary
A contact element for a probe head for an electronic device test apparatus is disclosed, having a body extending along a longitudinal axis between a first and a second opposite contact end, each made of electrically conductive material. The body includes a first section which extends over a distance less than 1000 μm along the longitudinal axis starting from the first contact end towards the second contact end, a second section which extends along the longitudinal axis starting from the second contact end towards the first contact end, and a third section, interposed between the first and second sections, made of an electrically insulating material. The sections follow each other along the longitudinal axis so that the first contact end is included only in the first section, the second contact end is included only in the second section, and the third section electrically insulates the first section from the second section.