Segmented Signal Routing for Wide Bandwidth Transceiver Testing
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Solution Overview
Problem
Current wireless device test systems require expensive, high-bandwidth test equipment to test signals exceeding 80 MHz, which is cost-inefficient and limits the ability to test devices adhering to standards like IEEE 802.11ac, as existing testers are inadequate for 160 MHz wide signals.
Innovation Solution
Employing multiple data packet signal testers with narrower bandwidths to process respective portions of wider bandwidth signals, allowing lower-cost equipment to test signals up to 160 MHz by routing signal components between testers during different time intervals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If high-bandwidth test equipment is used to test signals exceeding 80 MHz, then test capability for wide bandwidth signals is improved, but equipment cost increases significantly
Solution Approach 1:
The patent divides a wide bandwidth signal (e.g., 160 MHz) into multiple narrower bandwidth segments (e.g., two 80 MHz segments). Each segment is routed to a separate narrow-bandwidth tester for parallel processing. This segmentation allows the use of multiple lower-cost testers instead of one expensive high-bandwidth tester, directly resolving the contradiction between test capability and equipment cost.
2Measurement precision
If test equipment bandwidth is increased to support 160 MHz signals, then measurement capability is improved, but the number of available test points decreases
Solution Approach 1:
By segmenting the wide bandwidth signal into multiple narrower bands and routing them to different testers, the system maintains narrow bandwidth settings on each tester. This preserves the advantage of narrow bandwidth testers which offer more test points per channel, while still achieving comprehensive coverage of the wide bandwidth signal through parallel processing of segments.
Solution Approach 2:
The patent combines results from multiple narrow-bandwidth testers to achieve comprehensive analysis of the wide bandwidth signal. Each tester provides detailed measurements on its assigned segment, and the combined results give complete coverage of the full bandwidth, effectively merging the capabilities of multiple testers to overcome the limitations of individual narrow bandwidth devices.
Data Source
AI summary
System and method for using multiple data packet signal testers having narrower data packet signal bandwidths for testing multiple data packet signal transmitters having wider data packet signal bandwidths. Using multiple data packet signal testers with narrower receiver bandwidths to process respective portions of the wider bandwidth of the data packet signals produced by the devices under test (DUTs) enables use of lower cost, narrower-bandwidth test equipment to test wide-bandwidth signals.


